2019
DOI: 10.1016/j.optmat.2019.03.022
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Electrical properties and spectroscopic ellipsometry studies of covellite CuS thin films deposited from non ammoniacal chemical bath

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Cited by 23 publications
(6 citation statements)
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“…Considering that the three samples have similar particle sizes and surface passivation, this phenomenon is speculated to stem from the notable difference in their hole densities, as already evidenced by the above XRD, Raman, and XPS analysis of the disulfide bond (i.e., Figure e,f,h and Table S2). For clarity, the Mie–Drude model simulation , and the hall-effect measurement were specifically adopted to quantifying the hole density in the three sample. As shown in Table S2, the two methods give similar values and a similar variation trend for the hole density, i.e., the longer the reaction time, the fewer holes that are detected in the samples.…”
mentioning
confidence: 99%
“…Considering that the three samples have similar particle sizes and surface passivation, this phenomenon is speculated to stem from the notable difference in their hole densities, as already evidenced by the above XRD, Raman, and XPS analysis of the disulfide bond (i.e., Figure e,f,h and Table S2). For clarity, the Mie–Drude model simulation , and the hall-effect measurement were specifically adopted to quantifying the hole density in the three sample. As shown in Table S2, the two methods give similar values and a similar variation trend for the hole density, i.e., the longer the reaction time, the fewer holes that are detected in the samples.…”
mentioning
confidence: 99%
“…However, among all the nanohybrid devices, the lowest V SET / V RESET of ∼−0.44 ± 0.10/+0.50 ± 0.10 V is exhibited by the RCS 3 device followed by the RSS 4 and RZS 4 devices with V SET / V RESET values of ∼−0.68 ± 0.08/+0.79 ± 0.09 V and −1.2 ± 0.1/+3.15 ± 0.15 V, respectively. This may be due to the increase in resistivity from CuS → SnS → ZnS as reported earlier. The materials with higher resistivity require much higher voltage for electron flow, which results in higher values of V SET / V RESET for rGO-ZnS. Furthermore, to test the stability of the nanohybrid devices, retention and endurance tests were performed for 10 4 s and 10 3 cycles, respectively, and are shown in Figure d,e and Figures S6–S11.…”
Section: Resultsmentioning
confidence: 82%
“…The carrier mobility decreases with an increasing copper concentration in the thin films, decreasing from 4 and reaching 1 cm 2 /(V s), where these values are like others reported elsewhere. , This decreasing mobility trend may be influenced by the continuous formation of tiny CuS covellite crystals in the films, which increase the carrier concentration but decrease the mobility simultaneously. The decrease in mobility is therefore mainly attributed to the varying morphology of the films that affect the transport of holes through the films, where the increasing incipient crystallites act as trapping centers hindering the carrier mobility. , …”
Section: Resultsmentioning
confidence: 99%