Objectives: 1. To prepare SrBi 4 Ti 4 O 15 ceramics via solid-state reaction method. 2. To make a systematic investigations on structural and dielectric properties of SBT ceramics. Methods: The structural information of Strontium Bismuth Titanate (SBT) ceramics is examined by X-ray diffraction and Raman spectroscopy techniques. The surface morphology and elemental analysis of SBT ceramic is employed by scanning electron microscope attached with energydispersive X-ray spectroscopy. The dielectric measurements of SBT ceramics were performed using the impedance analyzer HIOKI-3532 LCR meter. Findings: From the X-ray diffraction studies, SBT exhibits a strongest diffraction peak (1 1 9) with the lattice parameters a = 5.428 Å, b = 5.423 Å, and c = 42.146 Å. The diffraction patterns were indexed to the orthorhombic phase. The surface morphology of the samples shows plate-like morphology with a grain size of ~1µm. The temperature-dependent ac conductivity confirms the thermally activated conduction mechanism. The ac conductivity of SBT ceramic was increased from 2.25 × 10 -5 to 7.16 × 10 -4 Ω.m -1 with an increase of frequency from 10 kHz to 1 MHz. The high curie temperature at ~540 • C, and low dielectric loss of ~0.031 for SBT ceramics can be appropriate for high-temperature electronic applications. Novelty: SBT ceramic exhibits enhanced electrical conductivity value (7.16 × 10 -4 Ω.m -1 )and makes it suitable for electronic device applications.