2014
DOI: 10.1063/1.4894451
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Electrical transport properties of (BN)-rich hexagonal (BN)C semiconductor alloys

Abstract: The layer structured hexagonal boron nitride carbon semiconductor alloys, h-(BN)C, offer the unique abilities of bandgap engineering (from 0 for graphite to ∼6.4 eV for h-BN) and electrical conductivity control (from semi-metal for graphite to insulator for undoped h-BN) through alloying and have the potential to complement III-nitride wide bandgap semiconductors and carbon based nanostructured materials. Epilayers of (BN)-rich h-(BN)1-x(C2)x alloys were synthesized by metal-organic chemical vapor deposition (… Show more

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Cited by 22 publications
(10 citation statements)
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“…It is clearly seen that, for all concentrations of carbon, separation of graphene (GR) and h‐BN phases appears. This result is in accordance with experimental results, that frequently report clustering of GR and h‐BN in ternary alloys . On the basis of our theoretical investigation, this result can be explained by the fact that C‐C and B‐N bonds are much more energetically favorable in comparison to C‐N and particularly to C‐B bonds, thus during MC simulation system tends to minimize number of the latter.…”
Section: Resultssupporting
confidence: 92%
“…It is clearly seen that, for all concentrations of carbon, separation of graphene (GR) and h‐BN phases appears. This result is in accordance with experimental results, that frequently report clustering of GR and h‐BN in ternary alloys . On the basis of our theoretical investigation, this result can be explained by the fact that C‐C and B‐N bonds are much more energetically favorable in comparison to C‐N and particularly to C‐B bonds, thus during MC simulation system tends to minimize number of the latter.…”
Section: Resultssupporting
confidence: 92%
“…All layers were grown using hydrogen as a carrier gas. Similar to previous studies, [38][39][40] high resolution x-ray photoelectron spectroscopy (XPS) measurements were employed to estimate the carbon doping concentration (N C ) and N C is around 1 Â 10 21 cm À3 as determined from XPS tight scans after removing surface contaminants by Arþ ion sputtering. Undoped h-BN epilayers with a thickness of about 60 nm were also grown at the same growth conditions for comparison measurements.…”
Section: (A) a A)mentioning
confidence: 99%
“…All data were analyzed consistently using Multipak software package to determine the atomic compositions. 9,13 Table I shows average B, N, and C concentrations for the h-(BN) 1Àx (C 2 ) x epilayers grown under 1, 2, and 3 sccm NH 3 flow rates obtained from multiple measurements on a given sample. Quantification of errors was obtained from variation in XPS spectra when acquired from different regions of a given sample.…”
Section: Resultsmentioning
confidence: 99%
“…This was achieved via the use of square shaped sample geometry with small ohmic contacts fabricated on the four corners of the sample surface. 9,13,[17][18][19] The microscope image of a fabricated h-(BN) 1Àx (C 2 ) x alloy (x ¼ 0.95) sample with four ohmic contacts (Ni/Au bilayers) on the corners is shown in Fig. 2(a).…”
Section: Resultsmentioning
confidence: 99%
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