Electro-optic sampling system for the testing of high-speed integrated circuits using a free running solid-state laser

Abstract

Abstruct-This paper deals with the indirect electro-optic sampling technique for the low-invasive detection of periodical voltage waveforms on lines in high-speed integrated circuits. The system introduced here is based on a passive mode-coupled Ti:Sapphire-Laser as light source for generating optical pulses in the subpicosecond regime. Therefore, we have to synchronize the resulting electric measurement signal and its external trigger onto the pulse repetition rate of this free running solid-state laser. The multi user function of the laser system forces us to transmit the pulses via a single-mode fiber into the measurement setup. For that purpose we developed a special optical arrangement to minimize the widening of the pulses in the time domain. The system's high-temporal resolution of nearly 10 ps in combination with its high-voltage sensitivity of about 800 p V / is demonstrated by measurements of an integrated microwave frequency divider.

High-speed InGaAs thin film MSM photodetector characterization using a fiber-based electro-optic sampling system

“…Conventional electro optic sampling systems [1][2] use free space optics, which are not convenient for high throughput measurements due to alignment. In this paper, an optical fiber-based electro-optic sampling system is introduced for high speed thin film photodetector impulse measurements.…”