2022
DOI: 10.5796/electrochemistry.22-66093
|View full text |Cite
|
Sign up to set email alerts
|

Electrochemical In Situ/<i>operando</i> Spectroscopy and Microscopy Part 1: Fundamentals

Abstract: Spectroscopic and microscopic techniques are complementary to electrochemical studies because electrochemical data consists of current, voltage and time, and has no direct information concerning the chemical structure of active species. Hence electrochemical in situ/ operando spectroscopy and microscopy become powerful tools for identification of the electrochemically active species during the electrochemical reactions. The present comprehensive paper provides the fundamental theory, cell design concepts, and … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2024
2024
2024
2024

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 85 publications
0
1
0
Order By: Relevance
“…diamond) which can be challenging. 7,8 A detailed description of typical setups and applications for vibrational spectroscopies for operando electrochemical studies can be found in the article of M. Matsui et al 9 Another popular technique to probe the electronical structure of a superficial layer is X-ray photoelectron spectroscopy (XPS). In recent years, the XPS signal at near ambient pressure (NAP-XPS) has been considerably improved through the implementation of differential pumping of gasses with low cross-section, together with electrostatic focusing systems in the analyzer.…”
Section: Introductionmentioning
confidence: 99%
“…diamond) which can be challenging. 7,8 A detailed description of typical setups and applications for vibrational spectroscopies for operando electrochemical studies can be found in the article of M. Matsui et al 9 Another popular technique to probe the electronical structure of a superficial layer is X-ray photoelectron spectroscopy (XPS). In recent years, the XPS signal at near ambient pressure (NAP-XPS) has been considerably improved through the implementation of differential pumping of gasses with low cross-section, together with electrostatic focusing systems in the analyzer.…”
Section: Introductionmentioning
confidence: 99%