2019
DOI: 10.1021/acs.jpcc.9b00282
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Electrochemical Surface Oxidation of Copper Studied by in Situ Grazing Incidence X-ray Diffraction

Abstract: Grazing incidence X-ray diffractometry (GIXRD) can deliver integral information on the structure and chemistry of surface near regions, which can be beneficial for functional materials related to interfacial reactions. Here, we present an in situ laboratory GIXRD setup for electrochemical experiments. The method is capable of directly correlating changes of the crystalline surface structure to the electrochemical conditions. It combines cyclovoltametric (CV) and chronoamperometric (CA) curves of crystalline sa… Show more

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Cited by 42 publications
(26 citation statements)
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“…7 at % of residual CuI. These results also reveal the higher sensitivity of HERFD‐XANES measurements acquired in grazing configuration to Cu 2 O and CuI species as compared to GI‐XRD which only shows metallic Cu peaks after CO 2 RR (Supporting Information, Figure S2) …”
Section: Resultsmentioning
confidence: 75%
See 1 more Smart Citation
“…7 at % of residual CuI. These results also reveal the higher sensitivity of HERFD‐XANES measurements acquired in grazing configuration to Cu 2 O and CuI species as compared to GI‐XRD which only shows metallic Cu peaks after CO 2 RR (Supporting Information, Figure S2) …”
Section: Resultsmentioning
confidence: 75%
“…These results also reveal the higher sensitivity of HERFD-XANES measurements acquired in grazing configuration to Cu 2 Oa nd CuI species as compared to GI-XRD which only shows metallic Cu peaks after CO 2 RR (Supporting Information, Figure S2). [36,37] Quasi in situ X-ray photoelectron spectroscopy (XPS) measurements were performed to probe the chemical state and composition of the surface of the Cu catalysts during CO 2 RR. Theelectrochemical cell was directly attached to the Figure 3a nd the Supporting Information, Figures S12 and S13.…”
Section: Resultsmentioning
confidence: 99%
“…Before the oxidation in air, the presence of only one sharp Cu (111) peak at ∼ 43.3°in the XRD pattern (black line in Figure 4A) confirmed the high crystallinity of the Cu foil. After the copper oxidation, a tiny XRD peak located at ∼ 38.7°appeals (blue line in Figure 4A), revealing the formation of CuO (111) on the top of the copper foil (Scherzer et al, 2019;Chen et al, 2020). A zoomin XRD spectrum as displayed in Figure 4B further confirms the presence of the CuO (111).…”
Section: Resultsmentioning
confidence: 78%
“…10 Monolagen abgeschätzt. [103] Die elektrochemische Oxidation von Kupfer führt zu einer Passivschicht, [104] die aus einem Gemisch von CuO und Cu 2 O besteht und ebenfalls sehr dünn ist.…”
Section: Methodsunclassified