1999
DOI: 10.1002/(sici)1521-396x(199905)173:1<73::aid-pssa73>3.0.co;2-8
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Electrodeposition of Thin Films and Multilayers on Silicon

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Cited by 72 publications
(35 citation statements)
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“…The electrodeposition of thin films and multilayers of the metals Cu, Co and Ni directly on the surface of ntype silicon substrates were studied by Pasa and Schwarzacher [116]. Different aqueous electrolytes containing sulphates or sulphamates of the metals and supporting additives were used.…”
Section: Electrodeposition Of Multilayersmentioning
confidence: 99%
“…The electrodeposition of thin films and multilayers of the metals Cu, Co and Ni directly on the surface of ntype silicon substrates were studied by Pasa and Schwarzacher [116]. Different aqueous electrolytes containing sulphates or sulphamates of the metals and supporting additives were used.…”
Section: Electrodeposition Of Multilayersmentioning
confidence: 99%
“…For plain magnetic layers with very small Ohmic resistance the substrate leakage current is negligible and magnetoresistance measurements can be performed. 28 However, for patterned magnetic layers such as the inverse sphere magnetic antisphere arrays shown in Fig. 5 the resistance is substantially higher and suppression of leakages becomes paramount.…”
Section: -3mentioning
confidence: 99%
“…For the experiments described in this paper, the electrical contact to the wafer is made through contacts along the circumference on the wafer (peripheral contact), see figure 2. In order to avoid significant resistance to the current and to provide a uniform current distribution, the sheet resistance (R ) should be low, typically under 0.5 per square [5]. In the case of a wafer with a 0.01 µm Cr adhesion layer and a 0.1 µm thick Au conducting layer on top, this resistance is about 0.2 per square (table 2).…”
Section: Theoretical Considerationsmentioning
confidence: 99%