“…2d , for the as-grown MQW sample, the peaks at 230, 302, 417, and 437 cm −1 are assigned to Si(2TA) L , Si(2TA) X , Si-Ge phonon mode, and Si-Si phonon (local) modes, respectively. For the ICP-etched samples, both peaks of Ge(LO) and Si-Ge mode have a redshift compared to the as-grown MQW sample, which is mainly resulting from the compressive strain relaxation [ 13 ]. The Raman results prove that the crystalline quality of the ICP-etched samples was not damaged during the etching process.…”