Proceedings of ASP-DAC/VLSI Design 2002. 7th Asia and South Pacific Design Automation Conference and 15h International Conferen
DOI: 10.1109/aspdac.2002.994950
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Electromigration avoidance in analog circuits: two methodologies for current-driven routing

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Cited by 20 publications
(15 citation statements)
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“…As can be seen in Table 2, the wire area and routing area consumption of our approach was less as compared to both edge of mesh graph G currently evaluated edge edge of routing tree R (11) terminal distance in LU current strength in mA the manually adjusted layouts and the strategies presented in [14]. (The approaches in [14] minimize only the routing length and not the overall wire area.)…”
Section: Implementation and Resultsmentioning
confidence: 91%
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“…As can be seen in Table 2, the wire area and routing area consumption of our approach was less as compared to both edge of mesh graph G currently evaluated edge edge of routing tree R (11) terminal distance in LU current strength in mA the manually adjusted layouts and the strategies presented in [14]. (The approaches in [14] minimize only the routing length and not the overall wire area.)…”
Section: Implementation and Resultsmentioning
confidence: 91%
“…We compared our routing results with layouts that were semi-automatically routed by experienced designers (using Mentor Graphic's IRoute tool) and afterwards manually adjusted for currentdensity. We also compared our results to two approaches presented in [14]. In order to allow a fair comparison, the same detailed router was used in all cases (except for the manually generated designs).…”
Section: Implementation and Resultsmentioning
confidence: 99%
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