Electron Conditioning of Technical Aluminium Surfaces:  Effect on the Secondary Electron Yield

Pimpec, F Le

doi:10.2172/839813

Cited by 5 publications

(7 citation statements)

References 3 publications

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“…This shift indicates the decrease of the yield. Similar effects of the electron bombardment have been reported by other authors [Le Pimpec et al, 2005] for planar oxidized samples. We have observed a very slow relaxation towards the situation before the bombardment with a characteristic time of tens of hours.…”

Section: Experimental Estimation Of the Crossover Energysupporting

confidence: 89%

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Influence of the Electric Field on Secondary Electron Emission Yield

Beránek¹,

Richterová²,

Němeček³

et al. 2008

AIP Conference Proceedings

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We present results of the investigation of secondary electron emission from spherical amorphous carbon grains of 3 to 6 micrometers in diameter affected by a high surface field. In our experiment, we have applied a technique based on levitation of a single charged grain in the quadrupole trap. This grain was charged by an electron beam with an energy tunable up to 10 keV. During this process, the grain charge is continuously monitored. If the grain is charged by an appropriate energetic electron beam, its charge (and the corresponding surface potential and surface electric field) is set to a value when the yield of secondary emission is equal to unity (crossover point). The investigations reveal that the energy corresponding to the crossover point changes proportionally to the grain potential. This effect was attributed to an increase of the yield of secondary emission due to a large electric field at the grain surface. Moreover, the measurement of the net current on the grain induced by electrons with the energy between first and second crossover points indicates similar increase of the yield.

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Section: Experimental Estimation Of the Crossover Energysupporting

confidence: 89%

“…We should point out that all measurements except the one presented in Fig. 4 were carried out using very small dose of bombardment in order to avoid the conditioning effects of the electron beam [Le Pimpec et al, 2005].…”

Section: Resultsmentioning

confidence: 99%

Influence of the Electric Field on Secondary Electron Emission Yield

Beránek¹,

Richterová²,

Němeček³

et al. 2008

AIP Conference Proceedings

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“…Detailed comparisons with experiments will be a focus of our future work and we hope that our development of MAST-SEY will encourage others to further explore this issues as well. Experimental data reported for aluminum seems to be less consistent (not shown here as it varied widely and no reasonable quantitative comparison is possible), but the more recent ones suggest a maximum SEY for clean aluminum samples to be smaller than 1.8 [43], or even as low as 0.95 [42] value is much closer to the 0.89 obtained here with DFT than the value of 2.87 obtained with SPA, which value is clearly overestimated. All these conclusions indicate that the use of the new DFT based approach available in MAST-SEY significantly improves the result compared to experiment FIG.…”

Section: A Simulation Of Sey Of Copper and Aluminiummentioning

confidence: 73%

MAST-SEY: MAterial Simulation Toolkit for Secondary Electron Yield. A monte carlo approach to secondary electron emission based on complex dielectric functions

Polak

Морган

2021

Computational Materials Science

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is an open-source Monte Carlo code capable of calculating secondary electron emission ~~mg mput data ge~erate~ entirely from first principle (density functional theory) calculations. It utilizes the complex dielectric function and Penn's theory for inelastic scattering processes and relativistic Schrodinger theory by means of a partial-wave expansion method to govern elastic 'scattering. It allows the user to include explicitly calculated momentum dependence of the dielectric func~ion, as well as to utilize first-principle density of states in secondary electron generation, which provides a more complete description of the underlying physics. In this paper we thoroughly describe the theoretical aspects of the modeling, as used in the code, and present sample results obtained for copper and aluminum.

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“…2,7 Unfortunately, conditioning is a lengthy process and does not always result in SEY reductions. 2,8 Power level restrictions provide a more systematic approach to multipactor suppression. This method involves limiting the RF power to remain below the multipactor threshold.…”

Section: B Multipactor Suppressionmentioning

confidence: 99%

Engineered surfaces to control secondary electron emission for multipactor suppression

Sattler

Coutu

Lake

et al. 2016

2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS)

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A significant problem for space-based systems is multipactor-an avalanche of electrons caused by repeated secondary electron emission (SEE). The consequences of multipactor range from altering the operation of radio frequency (RF) devices to permanent device damage. Existing efforts to suppress multipactor rely heavily on limiting power levels below a multipactor threshold. 1 This research applies surface micromachining techniques to create porous surfaces to control the secondary electron yield (SEY) of a material for multipactor suppression. Surface characteristics of interest include pore aspect ratio and density. A discussion is provided on the advantage of using electroplating (vice etching) to create porous surfaces for studying the relationships between SEY and pore aspect ratio & density (i.e. porosity). Preventing multipactor through SEY reduction will allow power level restrictions to be eased, leading to more powerful and capable space-based systems.

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Electron Conditioning of Technical Aluminium Surfaces: Effect on the Secondary Electron Yield

Cited by 5 publications

References 3 publications

Influence of the Electric Field on Secondary Electron Emission Yield

Influence of the Electric Field on Secondary Electron Emission Yield

MAST-SEY: MAterial Simulation Toolkit for Secondary Electron Yield. A monte carlo approach to secondary electron emission based on complex dielectric functions

Engineered surfaces to control secondary electron emission for multipactor suppression

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