Nanowires - Fundamental Research 2011
DOI: 10.5772/18915
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Electron Diffraction and HRTEM Structure Analysis of Nanowires

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Cited by 2 publications
(2 citation statements)
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“…Therefore, by directly measuring the interplanar distances, one can determine the phase and orientation of the grains, and also estimate their size. For a brief review of SAED and HRTEM applied to nanowires, one can refer to [35].…”
Section: Electron Diffractionmentioning
confidence: 99%
“…Therefore, by directly measuring the interplanar distances, one can determine the phase and orientation of the grains, and also estimate their size. For a brief review of SAED and HRTEM applied to nanowires, one can refer to [35].…”
Section: Electron Diffractionmentioning
confidence: 99%
“…The electron beam was perpendicular to the Dy 2 O 3 (111) plane. Some spots are marked with (hkl) indices [10][11][12].…”
Section: Transmission Electron Microscopymentioning
confidence: 99%