The power of high resolution electron microscopy as a technique for the direct study of non-random disorder in layered minerals is illustrated by the discovery, reported herein, of two new polytypes (one of monoclinic, the other of trigonal symmetry) in the orthosilicate chloritoid. These new variants had hitherto escaped detection in previous X-ray studies of chloritoid. Several specimens of this layered mineral, which cleaves on {110} as well as the expected {001} planes, were also analysed in parallel by X-ray diffraction, the limitations of which are demonstrated by these investigations. The X-ray diffraction procedures, unlike the real-space electron microscopic approach, yield no information concerning the inhomogeneity of intergrowths of one polytype within others. Apart from the existence of new polytypes, unexpected structural faults, in which one polytypic variant terminates within another, have also been identified by electron microscopy. A plausible structural model, which describes the atomic reorganization and the implied change in chemical composition, is proposed for this fault.