Electron Microscope and Diffraction Study of Metal Crystal Textures by Means of Thin Sections

Heidenreich, R. D.

doi:10.1063/1.1698264

Cited by 219 publications

(26 citation statements)

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“…Biological applications of TEM are outside the scope of this review, but a few milestones in TEM of materials will be mentioned. In 1949 Robert Heidenreich of Bell Labs pioneered the study of metals by TEM, using an electrolytic method to prepare sufficiently thin specimens [3]. Seminal work on defects in metals was subsequently carried out by Peter Hirsch and colleagues in Cambridge who reported the first observations of moving dislocations in aluminium [4] and by Walter Bollman of the Battelle Laboratory in Geneva, who observed dislocations in stainless steel [5].…”

Section: The Development Of Transmission Electron Microscopymentioning

confidence: 99%

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Transmission Electron Microscopy of Carbon: A Brief History

Harris

2018

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Transmission electron microscopy (TEM) has been used in the study of solid carbon since the 1940s. A number of important forms of carbon have been discovered through the use of TEM, and our understanding of the microstructure of carbon has largely been gained through the application of TEM and associated techniques. This article is an attempt to present an historical review of the application of TEM to carbon, from the earliest work to the present day. The review encompasses both graphitic carbon and diamond, and spectroscopic techniques are covered, as well as imaging. In the final section of the review, the impact of aberration-corrected TEM on current carbon research is highlighted.

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Section: The Development Of Transmission Electron Microscopymentioning

confidence: 99%

“…It is particularly useful for light element analysis, and can provide information about bonding and oxidation state. Since the early 1990s, EELS has been increasingly used to study both sp 2 and sp 3 carbon and has helped to provide answers to some long-standing issues in carbon science.…”

Section: The Development Of Transmission Electron Microscopymentioning

confidence: 99%

Transmission Electron Microscopy of Carbon: A Brief History

Harris

2018

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“…[4][5][6] The n-value is controlled by grain size 7) or chemical composition. 8) Therefore, microstructure analyses by X-ray diffraction (XRD), [9][10][11] scanning electron microscope (SEM) [12][13][14] and electron backscatter diffraction…”

Section: Introductionmentioning

confidence: 99%

Development of Biaxial Tensile Test System for <i>In-situ</i> Scanning Electron Microscope and Electron Backscatter Diffraction Analysis

et al. 2016

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“…Furthermore, the functional features of EMs before 1950 were so poor that each individual dislocation could not be discriminated when Heidenreich first tried to observe dislocations in metals. 10) As mentioned, the direct observation of dislocations succeeded in 1956, as the functional features of EMs improved. The results were epoch-making, but even 100 kV EMs were not sufficient to determine the correct density of the dislocations, so that frequently no dislocations were observed even in heavily worked specimens.…”

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confidence: 99%

“…11) This meant that the value of P is almost saturated at about 500 kV due to the relativistic effect, and increases only 3.3 times compared to the value at 100 kV, even when the accelerating voltage is increased to infinity. 6), 10) Since the value of P was defined as the transmission distance of incident electrons until their intensity decreases to 1/e, most electron microscopists thought that the value of P corresponds to the maximum observable specimen thickness (t M ). 6), 8) This hypothesized voltage dependence of t M also seemed to be supported by some experimental data, 6),12), 13) which, however, did not take into account the objective aperture effect, as shown later.…”

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The importance of ultra-high voltage electron microscopy in materials science

Fujita

2005

Proceedings of the Japan Academy. Ser. B: Physical and Biologic

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Introduction. In natural science, there is a "threshold value" above which a new field of research is opened, and transmission electron microscopes (EMs) have opened such a new field. Ever since dislocation images were obtained with 100 kV EMs 1),2) in Europe and with a 50 kV EM in Japan 3) independently in 1956-57 by means of different specimen preparation methods, materials science has seen a rapid progress thanks to electron microscopy. Dislocations are the most important lattice defects, but their behavior is very sensitive to the thickness of the crystalline materials. As a result, not only the behavior but also the density of the dislocations changes dramatically when the specimen thickness becomes smaller than the critical value, and the changes depend on the kind of phenomena and materials involved. 4)-6) This is one reason why, in order to get the same information about the behavior of lattice defects in thin materials as one would get from bulk materials, highvoltage electron microscopes (HVEMs) are necessary.Practically, 500 kV-class HVEMs are sufficient for this purpose if the materials observed are made of light metals whose atomic number is smaller than 20, 6),7) but the accelerating voltage must be increased with increasing atomic number of the materials observed. Various phenomena occurring in bulk materials have generally been investigated in-situ with ultra-HVEMs with accelerating voltages at least higher than 2,000 kV (2 MV), and/or with HVEMs with voltages lower than 1,500 kV, and the mechanisms behind those phenomena have been made clear dynamically.8)The present report is mainly concerned with the importance of electron channeling at high voltages and with various applications of ultra-HVEMs in materials science.Voltage dependence of the maximum observable specimen thickness. In 1920-30, the structure sensitivity of the behavior of materials was considered to be closely related to existence of lattice defects, and a dislocation model was first proposed by Yamaguchi as reflecting the most important lattice defect. 9) After that, many theories were proposed regarding the dislo- Abstract: Natural science is now extensively developed thanks to electron microscopy, but around 1950, only thin specimens were used because of the low accelerating voltages. The behavior of crystalline materials is very sensitive to specimen thickness, and thus in Japan a practical 500 kV electron microscope was constructed in 1965 for thicker specimens. It was shown that simultaneous reflection increases with increasing accelerating voltage, so that the maximum observable specimen thickness increases almost linearly up to 500 kV. Since simultaneous reflection becomes prominent above 1,500 kV, the in-situ observation of various phenomena representative of most bulk materials has been carried out with an ultra-high voltage electron microscope, whose accelerating voltages can reach 3,000 kV. Thus, even the characteristics of high-Z materials have been clarified in detail, and new applications, such as foreign atom impla...

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Electron Microscope and Diffraction Study of Metal Crystal Textures by Means of Thin Sections

Cited by 219 publications

References 10 publications

Transmission Electron Microscopy of Carbon: A Brief History

Transmission Electron Microscopy of Carbon: A Brief History

Development of Biaxial Tensile Test System for <i>In-situ</i> Scanning Electron Microscope and Electron Backscatter Diffraction Analysis

The importance of ultra-high voltage electron microscopy in materials science

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