Electron microscopy at high voltages

Thomas, G.

doi:10.1080/14786436808223188

Cited by 55 publications

(13 citation statements)

References 10 publications

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“…The criterion adopted by Professor Thomas (Thomas, 1968) is that the critical thickness is the thickness at which the contrast of stacking-fault fringes is lost due to absorption effects. The results are summarized in Fig.…”

Section: Penetrating Powermentioning

confidence: 99%

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Performance and applications of the Toulouse 3 million volt electron microscope

Dupouy

1973

Journal of Microscopy

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his paper describes the electron microscope and gives details of its performance at an operating voltage of 3 MV.Some initial results are reported concerning : penetrating power; resolving power; studies of radiation damage, and other interactions between electrons and crystalline materials. Several observations are also described concerning biological materials (bacteria, frog skeletal muscle, filaments from mushroom spores . . .).Because at high voltage, radiation damage is considerably reduced, the results obtained indicate a new range of applications of high voltage electron microscopy in biological ultrastructure research.

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Section: Penetrating Powermentioning

confidence: 99%

“…In contrast to this, the increase in penetration for stainless steel is relatively small. (Thomas, 1968); AC, silicon g = 220 systematic; mr, stainless steel g = 11 1 systematic (Thomas, 1968).…”

Section: Penetrating Powermentioning

confidence: 99%

Performance and applications of the Toulouse 3 million volt electron microscope

Dupouy

1973

Journal of Microscopy

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“…Experimentally it has been found possible using 1 MeV electrons to make observations of defects (e.g. dislocations and stacking faults) in specimens as thick as 6-9 prn for the lightest elements such as aluminium and silicon (Humphreys et al, 1971;Thomas, 1968), 2-3 pm for medium atomic weights such as iron (Humphreys et al, 1971;Thomas, 1968;Hale, 1966), but still less than 1 pm for the heaviest elements such as gold and uranium (Humphreys et al, 1971;Foreman & Hudson, 1971). Further increases in penetration are achieved by using even higher energies, but only in the lightest elements (Thomas & Lacaze, 1973).…”

Section: A P P L I C a T I O N S T O T H I C K E R S P E C I M E N S mentioning

confidence: 99%

Current developments in the high voltage electron microscopy of metals and other materials

Goringe

1973

Journal of Microscopy

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The principal advantages of the high voltage electron microscope are first described. Examples are then quoted of various topics in the study of materials in which these advantages are being applied at present. The most obvious improvement, that of greater penetration is utilized in the study of thicker specimens, useful particularly for observation of multiphase solids, experiments in the microscope and environmental cells. The reduction in ionization damage with increasing energy allows observation of many susceptible materials, while the onset of displacement damage interferes with certain other observations. However, the study of displacement damage in nuclear materials using the very fine flux conditions in the HVEM has proved to be of great technological importance. Finally it is shown how a particular high voltage effect, the critical voltage, may be utilized.

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“…Graptolite rhabdosome fragments up to 5 microns thick were examined. Thomas (1968) indicated that useful photographs of stainless steel foils approximately 2 microns thick and foils of single crystal silicon 9 microns thick can be obtained with the high voltage electron microscope.…”

Section: Techniques and Proceduresmentioning

confidence: 99%

Electron Microscope Study of a Diplograptus Species

Berry

Takagi

1971

LET

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Specimens of Diplograptus sp. from the late Middle Ordovician Lebanon Limestone in central Tennessee have been isolated from the matrix and examined with transmission electron microscopes at 60 and 650 kv. The fine structure of the fusellar layer in the metasicula and in the thecae is a mesh formed from fibers. The cortical layer has two sublayers, one of which is a mesh that is closely similar to the mesh of the fusellar layer and the other is formed from two sets of long fibers that are oriented at moderate to high angles to each other. The prosicula outer wall is a loosely‐woven, open mesh formed of fibers that are 0.080–0.165 microns in diameter. The spiral thread appears to be a band that is also formed of interwoven fibers. The longitudinal rod is a bundle of long fibers. Prosicula microstructures of this Diplograptus are significantly different from those in an Orthograptus of the O. quadrimucronatus (Hall) group.

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Electron microscopy at high voltages

Cited by 55 publications

References 10 publications

Performance and applications of the Toulouse 3 million volt electron microscope

Performance and applications of the Toulouse 3 million volt electron microscope

Current developments in the high voltage electron microscopy of metals and other materials

Electron Microscope Study of a Diplograptus Species

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