2003
DOI: 10.1063/1.1595131
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Electron relaxation and transport dynamics in low-temperature-grown GaAs under 1 eV optical excitation

Abstract: Electron relaxation and transport dynamics in low-temperature-grown GaAs under 1 eV optical excitation was investigated by femtosecond transient transmission measurement and electro-optical sampling measurement in bulk samples and fabricated devices. An increase in the electron lifetime can be observed when the electron density is higher than 3×1017 cm−3. This effect is attributed to prolonged electron relaxation due to intervalley scattering of highly excited electrons and associated hot phonon effects. Our c… Show more

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Cited by 7 publications
(6 citation statements)
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“…The external light-THz conversion efficiency is a function of detector bias, optical excitation power, and antenna design. Under high bias voltage or high optical excitation, the conversion efficiency of the device saturates due to the carrier lifetime increasing effect in LTG-GaAs [8], [9]. The aim of this work is to find the optimum operation conditions of the device, such as applied bias voltage and excitation optical power, to maximize external conversion efficiency.…”
mentioning
confidence: 99%
“…The external light-THz conversion efficiency is a function of detector bias, optical excitation power, and antenna design. Under high bias voltage or high optical excitation, the conversion efficiency of the device saturates due to the carrier lifetime increasing effect in LTG-GaAs [8], [9]. The aim of this work is to find the optimum operation conditions of the device, such as applied bias voltage and excitation optical power, to maximize external conversion efficiency.…”
mentioning
confidence: 99%
“…For 1230-nm subband-gap excitation, carriers in the mid-gap states can be excited into the valley with high excess energy ( 300 meV), which is close to the offset energy ( 310 meV) of the valley relative to the bottom. These photoexcited electrons will suffer from the intervalley scattering effect (Gunn effect) more easily as compared to the case of short wavelength excitation [30], [31]. This effect should reduce the electron capture rate back to the defect states and cause the broadening of the carrier-lifetime-limited device responses.…”
Section: B Msm-twpd Characteristicsmentioning
confidence: 99%
“…2 and 3, although the long wavelength MSM-TWPD has a much longer length, the maximum output is much lower than the case of short wavelength excitation. To understand the nonlinear behavior of LTG-GaAs-based PD under different wavelength excitations (800 versus 1230 nm), we have also performed EO sampling measurements in these two wavelength regimes with different pumping power [30], [31]. Also shown beside the traces are the corresponding collected carrier densities, which can be obtained by dividing the collected charges by the device absorption volumes.…”
Section: B Msm-twpd Characteristicsmentioning
confidence: 99%
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