Electronic and Magneto-Transport Across the Heusler Alloy (Co2FeAl)/p-Si Interfacial Structure

Electronic and magneto-transport studies across the Co 2 FeAl (CFA)/n-Si interfacial structure have been carried out. Magnetic properties of the structure have also been studied from the M-H characteristics and magnetic force microscopy (MFM) features. Surface morphology of the CFA Heusler alloy thin films studied from atomic force microscopy. X-ray diffraction and X-ray photoelectron spectroscopy data of the structure reveals the formation of CFA alloy phase with L2 1 structure along with few silicide phases. MFM data reveals the formation of fine domain structure with average domain size of *17 nm with average magnetic signal strength of 0.19°. Electronic transport (I-V) characteristics shows the large reverse current as compared to forward current which indicates the spin based transport from CFA Heusler alloy side to semiconductor side. I-V characteristics performed in presence of magnetic field shows the magnetic field sensitivity for reverse bias.

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Electronic and Magneto-Transport Across the Heusler Alloy (Co2FeAl)/p-Si Interfacial Structure

Cited by 14 publications

References 22 publications

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Magnetic, structural and transport properties across the Heusler alloy (Co2FeAl)/n-Si interfacial structure

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