2003
DOI: 10.1063/1.1534938
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Electronic transport studies of single-crystalline In2O3 nanowires

Abstract: Single-crystalline In2O3 nanowires were synthesized and then utilized to construct field-effect transistors consisting of individual nanowires. These nanowire transistors exhibited nice n-type semiconductor characteristics with well-defined linear and saturation regimes, and on/off ratios as high as 104 were observed at room temperature. The temperature dependence of the conductance revealed thermal emission as the dominating transport mechanism. Oxygen molecules adsorbed on the nanowire surface were found to … Show more

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Cited by 214 publications
(110 citation statements)
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“…However, the velocity excursion of carriers of boron nanocones for Devices 1 and 2 is different at the same positive and negative voltages due to the diameter size distinctness of both ends, resulting in the variety of carrier mobility, which leads to the different saturation currents. The saturation behaviors were also observed in other systems, such as carbon nanotube devices, [27,28] ln 2 O 3 nanowire transistors, [29,30] and Cd-doped ZnO nanowires varistors. [31] The saturation occurred at the positive voltage larger than 1.0 V and negative voltage smaller than -1.0 V for carbon nanotubes devices and Cd-doped ZnO nanowires varistors.…”
mentioning
confidence: 59%
“…However, the velocity excursion of carriers of boron nanocones for Devices 1 and 2 is different at the same positive and negative voltages due to the diameter size distinctness of both ends, resulting in the variety of carrier mobility, which leads to the different saturation currents. The saturation behaviors were also observed in other systems, such as carbon nanotube devices, [27,28] ln 2 O 3 nanowire transistors, [29,30] and Cd-doped ZnO nanowires varistors. [31] The saturation occurred at the positive voltage larger than 1.0 V and negative voltage smaller than -1.0 V for carbon nanotubes devices and Cd-doped ZnO nanowires varistors.…”
mentioning
confidence: 59%
“…3b,d. These devices exhibit typical enhancement mode long-channel FET [35][36][37][38][39][40] . Because the extraction procedure for m eff involves uncertainties due to the required capacitance estimation (see Methods), NWTs can be compared with planar transistors by comparing the I on and g m per unit width (g m /W), using the nanowire diameter as the device width.…”
Section: Resultsmentioning
confidence: 99%
“…Photolithography was performed, followed by evaporating Ti±Au to contact both ends of the nanowires. [13] A typical SEM image of our device is shown in Figure 3a inset, indicating a channel length of 3 lm between the source and drain electrodes. The silicon substrate was used as a back gate.…”
mentioning
confidence: 99%