Electrooptic Inspection of Vector Leakage in Radiofrequency Multichip Modules

Rodenbeck, Christopher T.; Peterson, Kara J.; Sandoval, Charles E.; Brakora, K.; Thiesen, J.; Russick, Edward Mark; Ortiz, Ray A.

doi:10.1109/temc.2013.2265049

Cited by 3 publications

(2 citation statements)

References 23 publications

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“…Recently, electro-optic (EO) measurement methods have been used to measure the vector E-fields within these devices [5], [9]. This measurement technique relies on the E-field induced laser light polarization change in a birefringent dielectric material, known as Pockels effect.…”

Section: Introductionmentioning

confidence: 99%

Electro-Optic Near Field Imaging of High-Power RF/Microwave Transistors in Plastic Packages

Urbonas

Vanaverbeke²,

Kim³

et al. 2018

2018 91st ARFTG Microwave Measurement Conference (ARFTG)

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Abstract-In this paper, through-plastic vector E-field measurements of an LDMOS transistor in an over-molded plastic package are presented. The measurement system uses a commercially-available electro-optic system connected to an NVNA with a comb generator to non-invasively measure the phase-coherent multi-harmonic E-fields. The device is measured in a load-pull measurement system, which is used to present optimal source and load impedances to the transistor during the multi-harmonic E-field measurements. All three E-field components are measured at the fundamental (2.2 GHz) and two harmonics at P 1dB = 53.2 dBm.

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Section: Introductionmentioning

confidence: 99%

Electro-Optic Near Field Imaging of High-Power RF/Microwave Transistors in Plastic Packages

Urbonas

Vanaverbeke²,

Kim³

et al. 2018

2018 91st ARFTG Microwave Measurement Conference (ARFTG)

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“…The spatial resolution of the measurement technique is dependent on the laser beam spot size which can be as small as 0.5 µm [11]. The use of ultra-fast lasers combined with the temporal resolution of EO crystals allow measurements up to THz frequencies [12] using both internal [13]- [15] and external [16], [17] electro-optic sampling (EOS) techniques. The internal EOS technique relies upon the device substrate acting as a birefringent material limiting its applicability to a narrow range of semiconductors, and excludes it from packaged device measurements.…”

Section: Introductionmentioning

confidence: 99%

An Electro-Optic Pulsed NVNA Load–Pull System for Distributed <inline-formula> <tex-math notation="LaTeX">$E$ </tex-math> </inline-formula>-Field Measurements

Urbonas

Kim

Vanaverbeke

et al. 2018

IEEE Trans. Microwave Theory Techn.

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In this paper, a new combined electro-optic and pulsed nonlinear vector network analyser-based load-pull measurement system for distributed multi-harmonic electric field measurements is presented. The system uses an external electrooptic probe to measure cross-frequency phase-coherent multiharmonic vector E-fields with an 8 µm spatial resolution and 20 MHz-20 GHz bandwidth. We demonstrate the performance of the distributed phase-coherent E-field measurements of Ex, Ey and Ez components with 3 harmonics above a commercially available large periphery, packaged, laterally diffused metaloxide-semiconductor (LDMOS) transistor. The transistor was measured at 2.2 GHz under pulsed conditions with 10 µs pulse and 10 % duty cycle, while outputting 55.1 dBm of power. The measured electric fields of the operating transistor are animated for the first time and reveal complex non-uniform operation at harmonic frequencies.

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Visualization of the spatial–temporal evolution of continuous electromagnetic waves in the terahertz range based on photonics technology

Hisatake¹,

Pham²,

Nagatsuma³

2014

Optica

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Electrooptic Inspection of Vector Leakage in Radiofrequency Multichip Modules

Cited by 3 publications

References 23 publications

Electro-Optic Near Field Imaging of High-Power RF/Microwave Transistors in Plastic Packages

Electro-Optic Near Field Imaging of High-Power RF/Microwave Transistors in Plastic Packages

An Electro-Optic Pulsed NVNA Load–Pull System for Distributed <inline-formula> <tex-math notation="LaTeX">$E$ </tex-math> </inline-formula>-Field Measurements

Visualization of the spatial–temporal evolution of continuous electromagnetic waves in the terahertz range based on photonics technology

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