2007
DOI: 10.1149/1.2429044
|View full text |Cite
|
Sign up to set email alerts
|

Electropolishing of Copper in H[sub 3]PO[sub 4]

Abstract: Electropolishing copper in 14M normalH3PnormalO4 was studied using both ex situ and in situ optical techniques. First, an ex situ study revealed the influence of the electropolishing potential on the visual appearance and the surface topography. Gloss together with total integrated scattering reflected the changes in surface roughness as evidenced from optical profilometry images. Second, an in situ optical study using ellipsometry revealed the changes in the thickness of the surface film, as well as rough… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
9
0

Year Published

2008
2008
2022
2022

Publication Types

Select...
10

Relationship

0
10

Authors

Journals

citations
Cited by 24 publications
(9 citation statements)
references
References 26 publications
0
9
0
Order By: Relevance
“…The lack of this capability is surprising considering hundreds of papers are published each year on such structures. Electropolishing, mechanical polishing, 23 and bulk high pressure methods, 24 which work well for micro and macroscale objects, 25 cannot be used effectively to control surface roughness with nanostructured rods.…”
Section: Introductionmentioning
confidence: 99%
“…The lack of this capability is surprising considering hundreds of papers are published each year on such structures. Electropolishing, mechanical polishing, 23 and bulk high pressure methods, 24 which work well for micro and macroscale objects, 25 cannot be used effectively to control surface roughness with nanostructured rods.…”
Section: Introductionmentioning
confidence: 99%
“…The dissolution of copper proceeds through the stage of film formation, which consists of a mixture of oxides of one-and bivalent copper [23][24][25][26]. It is not excluded that the film at the surface of the anode can contain oxides with a non-stoichiometric composition or consist of a mixture of copper oxides and phosphates [27][28][29][30][31].…”
Section: Discussion Of Results Of Polarization Measurements Of the Comentioning
confidence: 99%
“…While there is an agreement in the literature that Cu ECP should be conducted under masstransfer-controlled conditions, there is no unequivocal explanation for the mass-transfer limitation. 44 Several researchers explained the limiting-current plateau in terms of the formation of a viscous liquidlike salt film, in which the surface concentration of the metal ions produced from the dissolution reaction exceeds a solubility limit, resulting in the precipitation of a salt film. [45][46][47][48] Finding alternatives to these mechanisms, other researchers proposed that mass-transfer limitation is due to the diffusion-limited transport of an acceptor species to the anode.…”
Section: Discussionmentioning
confidence: 99%