Electrostatic force microscopy study on the domain switching properties of the Pb(Zr0.2Ti0.8)O3 thin films with different crystallographic orientations for the probe-based data storage

Cho, Seong-Moon; Nam, Hojung; Park, Bae Ho; Jeon, Dae‐Young

doi:10.1016/j.ultramic.2008.04.021

Cited by 4 publications

(1 citation statement)

References 14 publications

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“…Scanning force microscopy techniques is a powerful tool in the study of ferroelectric domains as they help in directly visualizing polar nanoregions (in relaxor ferroelectrics) and in the study of domain dynamics [7][8][9][10][11]. Dynamic contact-electrostatic force microscopy (DC-EFM), a scanning force microscopy based technique, has been employed to study the domain structure in thin films [12][13][14][15][16][17].…”

Section: Introductionmentioning

confidence: 99%

Studies on Field Dependent Domain Structures in Multi-Grained 0.85PbMg_1/3Nb_2/3O3–0.15PbTiO₃ Thin Films by Scanning Force Microscopy

Saranya

John

Parui

et al. 2012

Integrated Ferroelectrics

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0.85PbMg 1/3 Nb 2/3 O 3 -0.15PbTiO 3 (0.85PMN-0.15PT) ferroelectric relaxor thin films have been deposited on La 0.5 Sr 0.5 CoO 3 /(111) Pt/TiO 2 /SiO 2 /Si by pulsed laser ablation by varying the oxygen partial pressures from 50 mTorr to 400 mTorr. The X-ray diffraction pattern reveals a pyrochlore free polycrystalline film. The grain morphology of the deposited films was studied using scanning electron microscopy and was found to be affected by oxygen pressure. By employing dynamic contact-electrostatic force microscopy we found that the distribution of polar nanoregions is majorly affected by oxygen pressure. Finally, the electric field induced switching in these films is discussed in terms of domain wall pinning.

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Section: Introductionmentioning

confidence: 99%

Studies on Field Dependent Domain Structures in Multi-Grained 0.85PbMg_1/3Nb_2/3O3–0.15PbTiO₃ Thin Films by Scanning Force Microscopy

Saranya

John

Parui

et al. 2012

Integrated Ferroelectrics

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Top-seeded solid-state single crystal growth of 0.75(Na0.5Bi0.5)TiO3-0.25SrTiO3 single crystals in oxygen and their characterization

Le,

Lee,

Kim

et al. 2024

J. Korean Ceram. Soc.

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Effect of oxygen pressure on the grain and domain structure of polycrystalline 0.85PbMg_1/3Nb_2/3O₃–0.15PbTiO₃ thin films studied by scanning probe microscopy

John

Saranya

Parui

et al. 2011

J. Phys. D: Appl. Phys.

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0.85PbMg1/3Nb2/3O3–0.15PbTiO3 ferroelectric–relaxor thin films have been deposited on La0.5Sr0.5CoO3/(1 1 1) Pt/TiO2/SiO2/Si by pulsed laser ablation at various oxygen partial pressures in the range 0.05 to 0.4 Torr. All the films have a rhombohedral perovskite structure. The grain morphology and orientation are drastically affected by the oxygen pressure, studied by x-ray diffraction and scanning electron microscopy. The domain structure investigations by dynamic contact electrostatic force microscopy have revealed that the distribution of polar nanoregions and their dynamics is influenced by the grain morphology, orientation and more importantly, oxygen vacancies. The correlation length extracted from autocorrelation function images has shown that the polarization disorder decreases with oxygen pressure up to 0.3 Torr. The presence of polarized domains and their electric field induced switching is discussed in terms of internal bias field and domain wall pinning. Film deposited at 0.4 Torr presents a curious case with unique triangular grain morphology and large polarization disorder.

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Electrostatic force microscopy study on the domain switching properties of the Pb(Zr0.2Ti0.8)O3 thin films with different crystallographic orientations for the probe-based data storage

Cited by 4 publications

References 14 publications

Studies on Field Dependent Domain Structures in Multi-Grained 0.85PbMg_1/3Nb_2/3O3–0.15PbTiO₃ Thin Films by Scanning Force Microscopy

Studies on Field Dependent Domain Structures in Multi-Grained 0.85PbMg_1/3Nb_2/3O3–0.15PbTiO₃ Thin Films by Scanning Force Microscopy

Top-seeded solid-state single crystal growth of 0.75(Na0.5Bi0.5)TiO3-0.25SrTiO3 single crystals in oxygen and their characterization

Effect of oxygen pressure on the grain and domain structure of polycrystalline 0.85PbMg_1/3Nb_2/3O₃–0.15PbTiO₃ thin films studied by scanning probe microscopy

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Electrostatic force microscopy study on the domain switching properties of the Pb(Zr0.2Ti0.8)O3 thin films with different crystallographic orientations for the probe-based data storage

Cited by 4 publications

References 14 publications

Studies on Field Dependent Domain Structures in Multi-Grained 0.85PbMg1/3Nb2/3O3–0.15PbTiO3 Thin Films by Scanning Force Microscopy

Studies on Field Dependent Domain Structures in Multi-Grained 0.85PbMg1/3Nb2/3O3–0.15PbTiO3 Thin Films by Scanning Force Microscopy

Top-seeded solid-state single crystal growth of 0.75(Na0.5Bi0.5)TiO3-0.25SrTiO3 single crystals in oxygen and their characterization

Effect of oxygen pressure on the grain and domain structure of polycrystalline 0.85PbMg1/3Nb2/3O3–0.15PbTiO3 thin films studied by scanning probe microscopy

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Studies on Field Dependent Domain Structures in Multi-Grained 0.85PbMg_1/3Nb_2/3O3–0.15PbTiO₃ Thin Films by Scanning Force Microscopy

Studies on Field Dependent Domain Structures in Multi-Grained 0.85PbMg_1/3Nb_2/3O3–0.15PbTiO₃ Thin Films by Scanning Force Microscopy

Effect of oxygen pressure on the grain and domain structure of polycrystalline 0.85PbMg_1/3Nb_2/3O₃–0.15PbTiO₃ thin films studied by scanning probe microscopy