Ellipsometric function of a film–substrate system: Applications to the design of reflection-type optical devices and to ellipsometry*

1984

J. Opt. Soc. Am. A

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, "Inverting the ratio of the complex parallel and perpendicular reflection coefficients of an absorbing substrate using a transparent thin-film coating," J. Opt. Soc. Am. A 1, 699-702 (1984) http://www.opticsinfobase.org/josaa/ abstract.cfm?URI=josaa-1-7-699 . An absorbing substrate can be coated with a transparent thin film of refractive index N 1 (within a certain range) and thickness d such that the ratio of complex reflection coefficients for the p and s polarizations of the film-covered substrate p = Rp/R, is the inverse of that of the film-free substrate p = RI/R 8 at an angle of incidence 0. A method to determine the relationship among 0, N 1 , and d that inverts p (i.e., makes p = 1/p) for a given substrate at a given wavelength is described and is applied to aluminum and silver substrates at 0.6328-and 10.6-gm wavelengths, respectively. Sensitivity of the inversion condition to incidence-angle and film-thickness errors is analyzed. p-inverting layers can be applied to one of the two metallic mirrors of a beam displacer or axicon to preserve the polarization state of incident monochromatic radiation.

Section: Conditions For Inverting Pmentioning

confidence: 99%

Inverting the ratio of the complex parallel and perpendicular reflection coefficients of an absorbing substrate using a transparent thin-film coating

1984

J. Opt. Soc. Am. A

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“…1), where the angles of incidence ki, 02, and 03 are in- (1) (2) Equation (2) shows that 01 must be >450. We assume an air (or vacuum) ambient of refractive index No = 1, a transparent film of refractive index N 1 , and an absorbing metallic substrate of complex refractive index N 2 for each and all mirrors.…”

Section: Design Proceduresmentioning

confidence: 99%

“…Figures 2 and 3 are nearly symmetrical with respect to the line p1,2 = 0.5 due to the near symmetry of the constant-angle-of-incidence contours (CAIC) in the complex p plane with respect to the real axis. 2 Table I Table II gives the magnitude and phase errors generated by thickness errors Ad, = Ad 2 = i1 nm and angle-of-incidence errors AOk, = A0 2 = A0 3 = +0.50. The errors at 85° are higher than those for the 800 designs.…”

Section: Design Proceduresmentioning

confidence: 99%

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Three-reflection halfwave and quarterwave retarders using dielectric-coated metallic mirrors

Thonn

1984

Appl. Opt.

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A design procedure is described to determine the thicknesses of single-layer coatings of a given dielectric on a given metallic substrate so that a specified net phase retardance (and/or a net relative amplitude attenuation) between the p and s polarizations is achieved after three reflections from a symmetrical arrangement of three mirrors that maintain collinearity of the input and output beams. Examples are presented of halfwave and quarterwave retarders (HWR and QWR) that use a ZnS-Ag film-substrate system at the C0 2 -laser wavelength X = 10.6 Aim. The equal net reflectances for the p and s polarizations are computed and found to be high (above 90%) for most designs. Sensitivity of the designs (deviation of the magnitude and phase of the ratio of net complex p and s reflection coefficients from design specifications) to small filmthickness and angle-of-incidence errors is examined, and useful operation over a small wavelength range (10-11 gim) is demonstrated.

“…[1][2][3][4][5][6][7] By the selection of the angle of incidence, film thickness, and refractive indices of both the film and metallic substrate, the p-and s-polarized components of incident monochromatic light can be reflected equally and with a specified differential reflection phase shift introduced between them. In general, these studies involved isotropic films.…”

Section: Introductionmentioning

confidence: 99%

Infrared quarter-wave reflection retarders designed with high-spatial-frequency dielectric surface-relief gratings on a gold substrate at oblique incidence

Liu

1996

Appl. Opt.

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One-and two-dimensional high-spatial-frequency dielectric surface-relief gratings on a Au substrate are used to design a high-reflectance quarter-wave retarder at 70°angle of incidence and 10.6-m light wavelength. The equivalent homogeneous anisotropic layer model is used. It is shown that equal and high reflectances ͑Ͼ98.5%͒ for the p and the s polarizations and quarter-wave retardation can be achieved with two-dimensional ZnS surface-relief gratings. Sensitivities to changes of incidence angle, light wavelength, grating filling factor, and grating layer thickness are considered.