We present a complete all-optical-processing polarization-based binary-logic system, by which any logic gate or processor can be implemented. Following the new polarization-based logic presented in [Opt. Express 14, 7253 (2006)], we develop a new parallel processing technique that allows for the creation of all-optical-processing gates that produce a unique output either logic 1 or 0 only once in a truth table, and those that do not. This representation allows for the implementation of simple unforced OR, AND, XOR, XNOR, inverter, and more importantly NAND and NOR gates that can be used independently to represent any Boolean expression or function. In addition, the concept of a generalized gate is presented which opens the door for reconfigurable optical processors and programmable optical logic gates. Furthermore, the new design is completely compatible with the old one presented in [Opt. Express 14, 7253 (2006)], and with current semiconductor based devices. The gates can be cascaded, where the information is always on the laser beam. The polarization of the beam, and not its intensity, carries the information. The new methodology allows for the creation of multiple-input-multiple-output processors that implement, by itself, any Boolean function, such as specialized or non-specialized microprocessors. Three all-optical architectures are presented: orthoparallel optical logic architecture for all known and unknown binary gates, singlebranch architecture for only XOR and XNOR gates, and the railroad (RR) architecture for polarization optical processors (POP). All the control inputs are applied simultaneously leading to a single time lag which leads to a very-fast and glitch-immune POP. A simple and easy-to-follow step-by-step algorithm is provided for the POP, and design reduction methodologies are briefly discussed. The algorithm lends itself systematically to software programming and computer-assisted design. As examples, designs of all binary gates, multiple-input gates, and sequential and non-sequential Boolean expressions are presented and discussed. The operation of each design is simply understood by a bullet train traveling at the speed of light on a railroad system preconditioned by the crossover states predetermined by the control inputs. The presented designs allow for optical processing of the information eliminating the need to convert it, back and forth, to an electronic signal for processing purposes. All gates with a truth table, including for example Fredkin, Toffoli, testable reversible logic, and threshold logic gates, can be designed and implemented using the railroad architecture. That includes any future gates not known today. Those designs and the quantum gates are not discussed in this paper.

We present a new method to optically represent and implement binary logic, and we implement some unforced logic gates. The binary logic zero and one are taken to be an optical beam, or any electromagnetic wave, that is polarized at a selected state and its negation, orthogonal counterpart, or otherwise. In one implementation, a thin-film system is then designed and used so as it can move between 2 positions producing the net desired polarization change of the output. The output consists of a wave that is polarized either in the direction of the original logic 1 or 0 or any other chosen state and its negation, orthogonal counterpart. The system can be cascaded infinitely due to the fact that the output and input are both of the same format and that the logic zero and one are not dependant on the intensity of the input or the output light beam. The unforced gates exclusive OR and exclusive NOR along with a simple inverter are demonstrated in this communication. We present three design architectures, where each has two types of gates. In one type of gates the polarization state magnitude can carry information that can be employed for testability or reverse logic. XOR, XNOR, and inverter gate designs and operation are discussed in detail, and an easy-to-follow step-by-step algorithm is presented. The introduced architectures are easily adapted for simultaneous cascading, multiple input designs, and integrated optical architecture. * Patent Pending.

function of a film-substrate system: Applications to the design of reflection-type optical devices and to ellipsometry," J. Opt. Soc. Am. 65, 252-260 (1975)

The transmission ellipsometric function (TEF) of a film-substrate system relates the polarization change, upon transmission, of an electromagnetic wave obliquely incident on, and transmitted through, a film-substrate system. The behavior of the TEF depends on the category of the film-substrate system: negative, zero, or positive. The category is determined by the sign of [equation in text]: negative for a negative film-substrate system, zero for a zero system, and positive for a positive system. We discuss the behavior of the TEFs of the two transparent nonnegative film-substrate systems, zero and positive. We describe the TEF as two successive transformations and analyze its behavior as the angle of incidence and film thickness of the film-substrate system are changed. We use the constant-angle-of-incidence contours and constant- thickness contours to analyze and utilize that behavior. From the analysis and understanding of the behavior of the TEF, and from the definition of a polarization device as a film-substrate system that introduces prescribed polarization changes, we discuss the design of all possible types of polarization devices using either of the two systems. We present a design formula for each. We also present a general formula that is used for the design of any of the devices. Thin-film coatings are treated as polarization devices for the purposes of our discussion. We conclude with a brief discussion of suggested practical modifications to, and simplifications of, ellipsometric memory, which is an interesting application of polarization devices for which there is a patent pending.

A novel and very simple ellipsometer for the characterization of film-substrate systems that employs one rotating optical element (a polarizer) is proposed. The ellipsometer is based on detecting the angles of incidence at which a film-substrate system has equal amplitude attenuations for light polarized parallel (p) and perpendicular (s) to the plane of incidence. At a certain wavelength, the film thickness of the filmsubstrate system has to lie within permissible-thickness bands (PTB) for the technique to apply.