1973
DOI: 10.1002/zfch.19730130426
|View full text |Cite
|
Sign up to set email alerts
|

Emissionsspektrographische Untersuchungen von Halbleitermaterialien in kompakter Form und als Dünnschichten; Das binäre System Silicium‐Chrom

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

1973
1973
1973
1973

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
references
References 3 publications
0
0
0
Order By: Relevance