2010
DOI: 10.1088/0268-1242/25/4/045018
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Empirical modeling of the refractive index for (AlGaIn)As lattice matched to InP

Abstract: A composition-dependent empirical interpolation formula for the refractive index of AlGaInAs epilayers lattice matched to InP substrate has been determined by using a reflection spectroscopy technique. The 2 μm thick (AlGaIn)As layers have been grown by MBE as well as MOVPE and were characterized by x-ray diffractometry and photoluminescence measurements. The measured data from these etalon structures were fitted by using a Sellmeier equation (single oscillator model) to retrieve the refraction index for wavel… Show more

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Cited by 12 publications
(11 citation statements)
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“…These are obtained from the fitting to the low temperature DBR reflectivity spectrum. They agree well with the values reported in the literature [ 97 , 98 , 99 , 100 ], including interpolation in the case of InGaAlAs material. The QD itself is modeled as a point dipole source.…”
Section: Methodssupporting
confidence: 91%
See 1 more Smart Citation
“…These are obtained from the fitting to the low temperature DBR reflectivity spectrum. They agree well with the values reported in the literature [ 97 , 98 , 99 , 100 ], including interpolation in the case of InGaAlAs material. The QD itself is modeled as a point dipole source.…”
Section: Methodssupporting
confidence: 91%
“…Fitting this dependence with the phenomenological Varshni formula shows discrepancies in the low and intermediate temperature range. This is typical for the low-dimensional structures [ 98 ] and points out that the changes in the energy bandgap are not the only effect influencing the emission energy. The determined α parameters are in the range of (0.24–0.38) meV/K ( Table 1 ).…”
Section: Resultsmentioning
confidence: 82%
“…The emission energy of the InGaAlAs layer confirms that the Al content in the InGaAlAs layer must be lower than 12%, and Ga content is close to the nominal 37%, together with 51% of In. [16,17] Additionally, we confirm that the emission centered at 0.914 eV originates spatially from the DBR section. We achieve this by comparing emission from the top and bottom of the complete structure with the emission from the top side of the structure etched down to the DBR section (Figure 1b).…”
Section: Resultssupporting
confidence: 69%
“…It is important to select the best mole fraction (x) value for the compound semiconductor to satisfy the lattice matching between the different alloys [39,40]. The refractive index (n) and the extinction coefficient (k) of the compound semiconductor vary based on its mole fraction [41]. Thus, to achieve the best values of such parameters which enhance the solar cell performance,…”
Section: Al Mole Fraction Optimizationmentioning
confidence: 99%