Proceedings of the International Symposium on Memory Systems 2017
DOI: 10.1145/3132402.3132416
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Enabling a reliable STT-MRAM main memory simulation

Abstract: STT-MRAM is a promising new memory technology with very desirable set of properties such as non-volatility, byteaddressability and high endurance. It has the potential to become the universal memory that could be incorporated to all levels of memory hierarchy. Although STT-MRAM technology got significant attention of various major memory manufacturers, to this day, academic research of STT-MRAM main memory remains marginal. This is mainly due to the unavailability of publicly available detailed timing paramete… Show more

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Cited by 17 publications
(21 citation statements)
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“…Worst-case Read/Write time for these devices is higher than the DRAM device [1,3,6,28]. However, average case read time is less than a DRAM device, which is verified via extensive simulations using popular cycle-accurate memory simulator NVmain [31].…”
Section: Sttmram: Spin-transfer Torque Magnetic Random Access Memorymentioning
confidence: 79%
“…Worst-case Read/Write time for these devices is higher than the DRAM device [1,3,6,28]. However, average case read time is less than a DRAM device, which is verified via extensive simulations using popular cycle-accurate memory simulator NVmain [31].…”
Section: Sttmram: Spin-transfer Torque Magnetic Random Access Memorymentioning
confidence: 79%
“…We model the STT-MRAM timings based on the parameters that are recently published in collaboration with Everspin Technologies Inc., one of the leading STT-MRAM manufacturers [20]. The published timing parameters enable a reliable methodology to simulate STT-MRAM without releasing confidential information about any product.…”
Section: Main Memory Platformmentioning
confidence: 99%
“…ST-1.2 timing parameters are optimistic and would correspond to major enhancements of the STT-MRAM technology, while ST-2.0 parameters are pessimistic estimations. Simulations performed with these timing parameters give us a reliable range of possible system performance impact for upcoming STT-MRAM main memory devices [20].…”
Section: Main Memory Platformmentioning
confidence: 99%
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