1993
DOI: 10.1063/1.352992
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End reflections and triple transit contribution to the band shape of magnetostatic volume wave delay lines

Abstract: An analysis of the signal reflections originating at the garnet film ends and of the triple transit between the microstrip transducers in magnetostatic volume wave delay lines has been performed. The influence of those effects on the band shape and on the insertion loss of magnetostatic wave devices has been inferred and compared with experimental results. In this framework, the possible utilization of the reflections for filterbank applications is also proposed.

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Cited by 5 publications
(2 citation statements)
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“…A large level of spurious ripples were observed from the Sezawa mode signal, which are mainly due to the triple transit effect, a second order effect where the wave travels three times the distance between input to output source. [24][25][26] These ripples might also come from the oblique reflection and diffraction effects from the interfaces or different layer boundaries among silicon, diamond, and ZnO.…”
Section: A Film and Device Characterizationmentioning
confidence: 99%
“…A large level of spurious ripples were observed from the Sezawa mode signal, which are mainly due to the triple transit effect, a second order effect where the wave travels three times the distance between input to output source. [24][25][26] These ripples might also come from the oblique reflection and diffraction effects from the interfaces or different layer boundaries among silicon, diamond, and ZnO.…”
Section: A Film and Device Characterizationmentioning
confidence: 99%
“…This is a guided Sezawa wave propagating in the interlayer between ZnO and diamond, which occurs when the bulk transverse velocity in the substrate (diamond and silicon) is larger than that in the top layer (ZnO). For the Sezawa mode SAW, a large level of spurious ripples was observed from the Sezawa mode signal, which is mainly due to the reported triple transit effect . The reflection effects under the metalized surface of the ZnO film cause the slight shift of the center frequency for the Sezawa mode SAW .…”
Section: Resultsmentioning
confidence: 96%