2021
DOI: 10.5185/amlett.2021.091664
|View full text |Cite
|
Sign up to set email alerts
|

Engineering in SnS-Based Solar Cell for an Efficient Device with Nickel Oxide (NiO) as the Hole Transport Layer

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2023
2023
2024
2024

Publication Types

Select...
3
1

Relationship

1
3

Authors

Journals

citations
Cited by 4 publications
(1 citation statement)
references
References 16 publications
0
1
0
Order By: Relevance
“…Such an increase in carrier recombination subsequently leads to a decrease in the V oc . [ 29 ] However, it appears that the V oc stabilizes after the 1.0 × 10 19 cm −3 threshold. This is because the recombination rate did not change substantially after this point.…”
Section: Analysis and Resultsmentioning
confidence: 99%
“…Such an increase in carrier recombination subsequently leads to a decrease in the V oc . [ 29 ] However, it appears that the V oc stabilizes after the 1.0 × 10 19 cm −3 threshold. This is because the recombination rate did not change substantially after this point.…”
Section: Analysis and Resultsmentioning
confidence: 99%