2016
DOI: 10.1016/j.spmi.2016.07.025
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Engineering of electronic and optical properties of PbS thin films via Cu doping

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Cited by 29 publications
(12 citation statements)
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“…The estimated dislocation density value is found to be 4.9x10 14 lines/m 2 . Similar results for PbS film have been observed in the literature [33,36].…”
Section: Resultssupporting
confidence: 91%
See 1 more Smart Citation
“…The estimated dislocation density value is found to be 4.9x10 14 lines/m 2 . Similar results for PbS film have been observed in the literature [33,36].…”
Section: Resultssupporting
confidence: 91%
“…Materials with an average crystallite size not exceeding about 100 nm are generally referred to as nanocrystalline or nanostructured [34]. The mean crystallite size of the sample is comparable with the results of literature [17,33,[35][36][37].…”
Section: Resultssupporting
confidence: 81%
“…3h, but with slightly lower values and variation between experiments, especially for the two most doped samples. These findings agree well with expectations due to the doping with Cu 2+ and with Hall effect measurements reported previously [29], where the resistivity has significantly decreased from pure to Cu-doped PbS.…”
Section: Surface Morphology and Topography Studiessupporting
confidence: 93%
“…Touati et al obtained the same behavior for PbS thin doped with Cu metal. 47 The lm's transparency of pure PbS below 900 nm increases with increasing Cr doping ratio. This behavior can be attributed to the grain growth seen in SEM results, giving rise to less scattering effects from the grain boundaries.…”
Section: Optical Propertiesmentioning
confidence: 99%