Enhanced Cavity Sensor in SIW Technology for Material Characterization

Massoni, Enrico; Siciliano, Giuseppe; Bozzi, Maurizio; Perregrini, Luca

doi:10.1109/lmwc.2018.2864876

Cited by 44 publications

(17 citation statements)

References 7 publications

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“…There exist many different measurement methods for different types of dielectric materials and different frequency bands, and all these methods have their own advantages and disadvantages [3]. These methods may be classified into a few common types, including parallel-plate capacitor [4], coaxial probe [5], [6], resonant cavity [7], [8], transmission line [9], [10], and free space [2], [11], [12]. The parallel-plate capacitor method measures the change in capacitance between the parallel plates, where the material is inserted between the plates, and calculates the dielectric constant and loss tangent from the change due to the insertion of the material.…”

Section: Characterization Of Dielectric Materialsmentioning

confidence: 99%

Characterization of Dielectric Materials at WR-15 Band (50–75 GHz) Using VNA-Based Technique

Wang

Shang

Ridler

et al. 2020

IEEE Trans. Instrum. Meas.

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This article presents an in-depth study of a new vector network analyzer (VNA)-based electromagnetic material measurement method relying on a commercially available material characterization kit (MCK). These MCKs provide effectively a guided free-space technique with less stringent requirement on alignment compared with conventional free-space techniques. Coupled with time gating, these MCKs employ a simple calibration, composed of reflect and thru standards only, prior to taking reflection and transmission S-parameter measurements. This MCK-based method complements other conventional measurement techniques, e.g., time-domain spectroscopy (TDS) and resonant cavity, allowing fast broadband dielectric material characterization over the millimeter-and submillimeter-wave frequency ranges. In this article, a WR-15 (50-75 GHz) MCK is utilized for the measurements of S-parameters for seven types of low-loss dielectric material. Their dielectric constant and loss tangent are extracted from S-parameters and are compared against literature values. A relatively good agreement is achieved. Moreover, an investigation into the uncertainties of the extracted dielectric constant and loss tangent is performed and reported.

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Section: Characterization Of Dielectric Materialsmentioning

confidence: 99%

Characterization of Dielectric Materials at WR-15 Band (50–75 GHz) Using VNA-Based Technique

Wang

Shang

Ridler

et al. 2020

IEEE Trans. Instrum. Meas.

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show abstract

“…To overcome the low quality factor of planar microstrip resonators, several research directions have been explored, such as dielectric resonators [13], [14], substrate-integrated waveguide (SIW) cavities [15], [16], microwave oscillators [17], and microwave-active resonator-based sensors [18], [19]. A high quality factor is achieved for the dielectric resonator by using a material with an extremely low dielectric loss.…”

Section: Introductionmentioning

confidence: 99%

Sensitive Relative Humidity Monitoring Sensor Based on Microwave Active Resonator With PEDOT:PSS

et al. 2020

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In this paper, a relative humidity monitoring sensor based on an active resonator with PEDOT:PSS is studied in the microwave regime. The proposed active resonator is patterned on a printed circuit board and excited by electromagnetic field coupling. The active resonator consists of two parts: a passive core resonator and an active circuit. The passive core resonator senses the humidity via the PEDOT:PSS conducting polymer film, which is located in the area of the passive core resonator with the strongest electric field. The active circuit compensates for the loss of the passive core resonator to enhance the quality factor and thus improve the sensitivity of the relative humidity sensor. By combining the passive core resonator with the active circuit, the active resonator exhibits a high quality factor (2887), which is 90 times that of the passive core resonator alone. Moreover, the sensitivity of the proposed humidity sensor is improved when using the active resonator. To verify the performance of the proposed humidity sensor, a commercial sensor is placed alongside the proposed sensor in a well-controlled environment chamber. According to the experimental results, as the relative humidity increases, the transmission coefficient (S 21 ) increases, while the resonance frequency decreases. As a result, the sensor exhibits an increase in S 21 of 3.58 dB and a decrease in the resonance frequency of 8.85 MHz when the relative humidity changes from 30% to 85%.

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“…This indicates that those sensors have the capability to detect the properties of materials in a wider range of complex permittivity. However, low values of normalized sensitivity have serious limitations for many recently reported studies, as shown in Table 5 [15,16,45,55,59,[100][101][102][103]. This might be due to producing a low Q-factor since they are planar structures and distribute the electric field along the large structure of the sensor, which reduces the interaction between the tested materials and the electric field of the sensor.…”

Section: Open Challengesmentioning

confidence: 99%

Review of Recent Microwave Planar Resonator-Based Sensors: Techniques of Complex Permittivity Extraction, Applications, Open Challenges and Future Research Directions

Alahnomi

Zakaria

Yussof

et al. 2021

Sensors

109

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Recent developments in the field of microwave planar sensors have led to a renewed interest in industrial, chemical, biological and medical applications that are capable of performing real-time and non-invasive measurement of material properties. Among the plausible advantages of microwave planar sensors is that they have a compact size, a low cost and the ease of fabrication and integration compared to prevailing sensors. However, some of their main drawbacks can be considered that restrict their usage and limit the range of applications such as their sensitivity and selectivity. The development of high-sensitivity microwave planar sensors is required for highly accurate complex permittivity measurements to monitor the small variations among different material samples. Therefore, the purpose of this paper is to review recent research on the development of microwave planar sensors and further challenges of their sensitivity and selectivity. Furthermore, the techniques of the complex permittivity extraction (real and imaginary parts) are discussed based on the different approaches of mathematical models. The outcomes of this review may facilitate improvements of and an alternative solution for the enhancement of microwave planar sensors’ normalized sensitivity for material characterization, especially in biochemical and beverage industry applications.

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Enhanced Cavity Sensor in SIW Technology for Material Characterization

Cited by 44 publications

References 7 publications

Characterization of Dielectric Materials at WR-15 Band (50–75 GHz) Using VNA-Based Technique

Characterization of Dielectric Materials at WR-15 Band (50–75 GHz) Using VNA-Based Technique

Sensitive Relative Humidity Monitoring Sensor Based on Microwave Active Resonator With PEDOT:PSS

Review of Recent Microwave Planar Resonator-Based Sensors: Techniques of Complex Permittivity Extraction, Applications, Open Challenges and Future Research Directions

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