2011
DOI: 10.1063/1.3605244
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Enhanced conversion efficiency of InGaN multiple quantum well solar cells grown on a patterned sapphire substrate

Abstract: This study demonstrated the enhanced conversion efficiency of an indium gallium nitride (InGaN) multiple quantum well (MQW) solar cell fabricated on a patterned sapphire substrate (PSS). Compared to conventional solar cells grown on a planar sapphire substrate, threading dislocation defects were found to be reduced from 1.28 × 109 to 3.62 × 108 cm−2, leading to an increase in short-circuit current density (JSC = 1.09 mA·cm−2) of approximately 60%. In addition, the open-circuit voltage and fill factor (VOC = 2.… Show more

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Cited by 36 publications
(18 citation statements)
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“…The shunt resistance exhibits nearly a linear decreasing relationship with Mg-doping concentration. It is known that R sh is mainly caused by short circuit pathways, such as threading dislocations (TDs) [17] , thus the linear relationship agrees well with the XRD and dark J-V measurement results. On the other hand, slight doping (5×10 17 cm -3 ) almost reduces the shunt resistance by half from sample A to sample B, but the effect becomes inconspicuous when the doping concentration is further increased.…”
supporting
confidence: 77%
“…The shunt resistance exhibits nearly a linear decreasing relationship with Mg-doping concentration. It is known that R sh is mainly caused by short circuit pathways, such as threading dislocations (TDs) [17] , thus the linear relationship agrees well with the XRD and dark J-V measurement results. On the other hand, slight doping (5×10 17 cm -3 ) almost reduces the shunt resistance by half from sample A to sample B, but the effect becomes inconspicuous when the doping concentration is further increased.…”
supporting
confidence: 77%
“…A better crystal quality means less defects, and this is good for the solar cell. The leakage current is caused by short circuit paths, such as the defects [8] . If the cell has less defects, it would have a large shunt resistance and a low leakage current, contributing to a high conversion efficiency.…”
Section: Experimental Methodsmentioning
confidence: 99%
“…For the solar cell, its equivalent circuit consists of a constant flow source, a parallel diode, a series resistance (R s ) and shunt resistance (R sh ), as shown in the figure 1(b). Shunt resistance is caused by the leakage current and series resistance is decided by the excessive contact resistance or the resistance of neutral region [8] . The external quantum efficiency (EQE) measurement was tested under monochromatic illumination by a tungsten halogen light source and the intensity of the incident light is calibrated by a reference silicon photodetector.…”
Section: Experimental Methodsmentioning
confidence: 99%
“…It is clear that the performance of the devices on PSS is better than the other one on the planar substrate. The reason is that the film grown on PSS exhibit better crystal qualities and optical qualities, which will be beneficial to enhancing light absorption and increasing the photon-generated carriers [11]. At the same time, it is also helpful to extending the light path length in the device and absorbing more photons.…”
Section: Methodsmentioning
confidence: 99%
“…It has been reported in others' works that there are a large number of stacking faults appeared during the initial growth of GaN buffer layer. These stacking faults interact with the threading dislocation (TD) defects, preventing further penetration into the MQWs [11]. Figure 3 shows the comparison of J-V characters of these two samples.…”
Section: Methodsmentioning
confidence: 99%