2013
DOI: 10.1063/1.4823537
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Enhanced deep ultraviolet inverse polarization transmission through hybrid Al-SiO2 gratings

Abstract: Surface plasmon polariton enhanced electroluminescence and electron emission from electroformed Al-Al2O3-Ag diodes

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Cited by 6 publications
(7 citation statements)
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“…First, the Al grating mask is fabricated on the bottom surface of the SiO 2 substrate by using atomic layer deposition, electronic beam lithography and reactive ion etching 24 26 . Second, the Al 2 O 3 spacer layer and the upper Al film are integrated on the Al grating mask of the SiO 2 substrate by using atomic layer deposition 26 or E-beam evaporation 28 . The integrated structure consisting of the SiO 2 substrate, the Al grating mask, the Al 2 O 3 spacer layer and the upper Al film is simply called mask stack.…”
Section: Resultsmentioning
confidence: 99%
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“…First, the Al grating mask is fabricated on the bottom surface of the SiO 2 substrate by using atomic layer deposition, electronic beam lithography and reactive ion etching 24 26 . Second, the Al 2 O 3 spacer layer and the upper Al film are integrated on the Al grating mask of the SiO 2 substrate by using atomic layer deposition 26 or E-beam evaporation 28 . The integrated structure consisting of the SiO 2 substrate, the Al grating mask, the Al 2 O 3 spacer layer and the upper Al film is simply called mask stack.…”
Section: Resultsmentioning
confidence: 99%
“…The integrated structure consisting of the SiO 2 substrate, the Al grating mask, the Al 2 O 3 spacer layer and the upper Al film is simply called mask stack. Thirdly, the lower Al film is fabricated on the top surface of the Si substrate by using atomic layer deposition 26 . Fourthly, the PR layer is coated on the top surface of the lower Al film.…”
Section: Resultsmentioning
confidence: 99%
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“…1(c), η TE of the Al-SiO 2 grating (red circles) is substantially larger than that of the Al-air grating (black squares): an average of 45% increase in the DUV band is obtained. By filling the slits with the substrate material-SiO 2 , the effective refractive index of TE guided mode approaching that of the SiO 2 substrate, leads to this increase in TE transmittance [3]. If we define the inverse polarization extinction ratio as C=10log 10 (ηTE /ηTM), we achieve C=35 dB at λ=196 nm, seen in Fig.…”
Section: Methodsmentioning
confidence: 99%