Please cite this article as: Masaya Akimoto, Taro Toyoda, Tsuyoshi Okuno, Shuji Hayase, Qing Shen, Effect of defects in TiO 2 nanotube thin film on the photovoltaic properties of quantum dot-sensitized solar cells, Thin Solid Films (2015),In the liquid-phase-deposition (LPD) method, the deposition temperature is considered to be one of the most important factors in TiO 2 nanotube crystal growth. We investigated the effects of the deposition temperature on the surface morphology and defects in TiO 2 nanotube (NT-TiO 2 ) thin film electrodes utilizing scanning-electron-microscopy (SEM), X-ray diffraction (XRD), and photoluminescence (PL), together with the effects of these on the photovoltaic characteristics of CdSe quantum dot (QD)-sensitized NT-TiO 2 solar cells. In addition, we studied the effect of these defects on the physical properties, such as the carrier recombination and electron transport at the TiO 2 and TiO 2 /QD interface. NT-TiO 2 electrodes prepared at low temperatures have a more uniform surface and lower defects than those prepared at high temperatures. From the PL measurements and the photovoltaic characterization such as shunt resistance (R sh ) and open circuit voltage decay (OCVD), these defects can act as carrier recombination centers. The defect density increases with increasing deposition temperature, leading to an increase in carrier recombination. Series resistances (R s ) of the solar cells with NT-TiO 2 electrodes prepared at high temperatures were larger than those of the solar cells with NT-TiO 2 electrodes prepared at low temperatures, suggesting that the defects can also affect the carrier transport characteristics. Eventually, CdSe QD-sensitized NT-TiO 2 solar cells employing NT-TiO 2 prepared at low temperatures showed higher conversion efficiencies than those prepared at high temperatures.
KEYWORDS: TiO 2 nanotube electrode, CdSe quantum dot, quantum dot sensitized solar A C C E P T E D M A N U S C R I P T ACCEPTED MANUSCRIPT 2 cells, surface morphology, defect, recombination, back electron transfer, open circuit voltage decay, electron lifetime * Corresponding authors.