2010
DOI: 10.1016/j.jcrysgro.2010.04.010
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Enhanced growth rates and reduced parasitic deposition by the substitution of Cl2 for HCl in GaN HVPE

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Cited by 8 publications
(7 citation statements)
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“…Although HF-VPE has some limitations, such as low grow rate and high Ga source temperature, in the 2000s several groups tried to use the HF-VPE process to grow GaN [30,31] . Nakamura et al [32][33][34][35] recently proposed a new HF-VPE design, as shown in Fig.…”
Section: Halogen-free Vpementioning
confidence: 99%
“…Although HF-VPE has some limitations, such as low grow rate and high Ga source temperature, in the 2000s several groups tried to use the HF-VPE process to grow GaN [30,31] . Nakamura et al [32][33][34][35] recently proposed a new HF-VPE design, as shown in Fig.…”
Section: Halogen-free Vpementioning
confidence: 99%
“…Because the pre-reaction between Ga metal and HCl is widely agreed as a nearly complete reaction through both experiment and calculation, 30,36,37) GaCl was input directly as III source in this simulation model. The chemical reactions in vapor phase were ignored.…”
Section: Chemical Modelmentioning
confidence: 99%
“…These particles may finally lead to small pits on the GaN layer surface as reported in Ref. 30. We designed the inverted wafer configuration to conquer this problem.…”
Section: Introductionmentioning
confidence: 96%
“…The issue of the high growth rate, low parasitic deposition, and preparation of the 2 in crack-free GaN layers in the Cl 2 based process has been discussed in Ref. [12].…”
Section: Growth Ratementioning
confidence: 99%