2020
DOI: 10.1088/2040-8986/ababe7
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Enhanced light emission from gap plasmons in nano-strip MIM tunnel junctions

Abstract: Electrical excitation of light using inelastic electron tunneling is a promising approach for the realization of ultra-compact on-chip optical sources with high modulation bandwidth. However, the practical implementation of these nanoscale light sources presents a challenge due to the low electron-to-photon transduction efficiencies. Here, we investigate designs for the enhancement of light generation and out-coupling in a periodic Ag-SiO2-Ag tunnel junction due to inelastic electron tunneling. The structure p… Show more

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Cited by 2 publications
(3 citation statements)
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“…The width of the source (S) as well as the directors ( D ) is taken as 35 nm, with the central element acting as the source, and is resonant at a wavelength of λ ∼ 695 nm. 19 The different emission channels when the central nano-strip is excited are also depicted, with θ g being the outcoupling angle of the scattered SPs. The far-field radiation pattern for the grating is shown in Fig.…”
Section: Discussionmentioning
confidence: 99%
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“…The width of the source (S) as well as the directors ( D ) is taken as 35 nm, with the central element acting as the source, and is resonant at a wavelength of λ ∼ 695 nm. 19 The different emission channels when the central nano-strip is excited are also depicted, with θ g being the outcoupling angle of the scattered SPs. The far-field radiation pattern for the grating is shown in Fig.…”
Section: Discussionmentioning
confidence: 99%
“…To mimic the current flow within the device, a dipole is placed at different positions within the gap of the source element ( S R / S L ) with dipole moment along the direction of flow of current ( y -axis). 19 The emitted intensity is collected and incoherently added (and averaged) at five different locations within the gap. Since the excitation source is a point dipole, a finite domain size of 35 μm truncated by PML (perfectly matched layer) boundary conditions is used to collect maximum emission from the simulated structure.…”
Section: Numerical Modellingmentioning
confidence: 99%
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