37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07) 2007
DOI: 10.1109/dsn.2007.41
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Enhanced Reliability Modeling of RAID Storage Systems

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Cited by 77 publications
(83 citation statements)
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“…The first device failure model is based on that used by Elerath and Pecht (cf. Table 2 in [6]). Disk failures are distributed according to a Weibull distribution with parameters γ = 0, η = 500000, and β = 1.12.…”
Section: Discussionmentioning
confidence: 99%
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“…The first device failure model is based on that used by Elerath and Pecht (cf. Table 2 in [6]). Disk failures are distributed according to a Weibull distribution with parameters γ = 0, η = 500000, and β = 1.12.…”
Section: Discussionmentioning
confidence: 99%
“…The specific device models used in the evaluation are based on the distributions that Elerath and Pecht used [6]. We believe that the models of Elerath and Pecht are as good as any currently available.…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…A handful of studies focus on node-oriented availability analysis for replicated systems using Markov models (for example, [25]), whereas many disk-oriented availability models are developed for RAIDs [26], [27]. Now we describe a node-oriented model for RS-coded storage.…”
Section: Availability Analysismentioning
confidence: 99%
“…There are also many studies on reliability modeling for RAID systems [13], [16], [30]. However, only a few of them cover silent data corruption.…”
Section: Related Workmentioning
confidence: 99%