2015
DOI: 10.1088/0957-4484/26/32/325301
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Enhanced sputter yields of ion irradiated Au nano particles: energy and size dependence

Abstract: Hexagonally arranged Au nanoparticles exhibiting a broad Gaussian-shaped size distribution ranging from 30 nm to 80 nm were deposited on Si substrates and irradiated with Ar(+) and Ga(+) ions with various energies from 20 to 350 keV and 1 to 30 keV, respectively. The size and energy dependence of the sputter yield were measured using high-resolution scanning electron microscopy image analysis. These results were compared to simulation results obtained by iradina, a Monte Carlo code, which takes the specifics o… Show more

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Cited by 23 publications
(23 citation statements)
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“…The blue curve shows the sputter yield calculated by iradina, the red curve shows the results of the model by Järvi et al [18]. The data points plotted in green are the results from the experiment presented in [31]. The dashed orange curve is the sputter yield by Järvi scaled to fit the experimental sputter yield.…”
Section: Development Of a MC Simulation Codementioning
confidence: 95%
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“…The blue curve shows the sputter yield calculated by iradina, the red curve shows the results of the model by Järvi et al [18]. The data points plotted in green are the results from the experiment presented in [31]. The dashed orange curve is the sputter yield by Järvi scaled to fit the experimental sputter yield.…”
Section: Development Of a MC Simulation Codementioning
confidence: 95%
“…In the y direction, the coordinates from the SEM images were corrected by the viewing angle of 52°in the SEM. The sputtering yields were calculated as described in [14,31]. The results of both experiment and simulation are still comparable for the used energies, since the difference in the sputtering yield for 25 and 30 keV Ga + irradiation is negligible [31].…”
Section: Methodsmentioning
confidence: 99%
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