2012
DOI: 10.1080/14786435.2012.705040
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Enhanced ultraviolet to near-infrared absorption by two-tier structured silicon formed by simple chemical etching

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Cited by 6 publications
(4 citation statements)
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“…The reflectance ( R ) and transmittance ( T ) were measured with an UV‐VIS‐NIR spectrophotometer equipped with an integrating sphere detector (PG2000‐Pro‐EX and NIR2500) from 0.25 to 2.5 µm. The absorptance ( A ) was calculated by formula: A = 1 −R−T . Hitachi S‐3400 scanning electron microscope (SEM) was used to characterize the surface morphologies of hyper‐doped silicon.…”
Section: Methodsmentioning
confidence: 99%
“…The reflectance ( R ) and transmittance ( T ) were measured with an UV‐VIS‐NIR spectrophotometer equipped with an integrating sphere detector (PG2000‐Pro‐EX and NIR2500) from 0.25 to 2.5 µm. The absorptance ( A ) was calculated by formula: A = 1 −R−T . Hitachi S‐3400 scanning electron microscope (SEM) was used to characterize the surface morphologies of hyper‐doped silicon.…”
Section: Methodsmentioning
confidence: 99%
“…Its unique optical and electronic properties indicate that the PS can be applied in optoelectronics, infrared detection, novel solar cells et al [1][2][3]. And benefiting from its high specific surface and high reactivity, the PS is also one kind of considerable material for gas sensors [4][5].…”
Section: Introductionmentioning
confidence: 99%
“…Although good absorption properties in the infrared were demonstrated, the high cost and complexity of this technique inhibits widespread adoption. More recently, less complex and cheaper techniques for increasing infrared absorption have been introduced based on chemical etching [9][10][11][12][13].…”
Section: Introductionmentioning
confidence: 99%