2010
DOI: 10.1002/smll.200902348
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Enhancement of Ionic Conductivity in Sm‐Doped Ceria/Yttria‐Stabilized Zirconia Heteroepitaxial Structures

Abstract: Recent developments in the fi eld of thin-fi lm growth technologies have allowed control at an atomic level of deposited layers, thus opening new perspectives in the fi eld of engineering of multilayers and heterostructures based on complex oxides. [ 1 ] In particular, it is expected that oxide heterostructures, with almost ideal interfaces, may lead to interesting artifi cial materials with novel properties. Artifi cial thin-fi lm oxide structures make the already complex individual bulk properties even more … Show more

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Cited by 107 publications
(129 citation statements)
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“…Interestingly, even if the (111) interface is predicted here to be thermodynamically more stable than the (100) interface, from a technological point of view the (100) interface is much more relevant, being the preferential growth orientation triggered by the experimentally used substrates (STO buffered MgO single crystals). 11 Starting from these junction structures, we investigated how the presence of a ZrO 2 /CeO 2 interface affects the equilibrium of intrinsic (oxygen vacancies V O ) and extrinsic defects (Gd and Y doping). First, we focused our attention on the possible effect of the epitaxial strain on the oxygen vacancy formation energy (E V O ) by comparing E V O in relaxed ZrO 2 and CeO 2 bulk phases with their values in bulk structures tetragonally deformed to reproduce the interfacial strain.…”
Section: Resultsmentioning
confidence: 99%
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“…Interestingly, even if the (111) interface is predicted here to be thermodynamically more stable than the (100) interface, from a technological point of view the (100) interface is much more relevant, being the preferential growth orientation triggered by the experimentally used substrates (STO buffered MgO single crystals). 11 Starting from these junction structures, we investigated how the presence of a ZrO 2 /CeO 2 interface affects the equilibrium of intrinsic (oxygen vacancies V O ) and extrinsic defects (Gd and Y doping). First, we focused our attention on the possible effect of the epitaxial strain on the oxygen vacancy formation energy (E V O ) by comparing E V O in relaxed ZrO 2 and CeO 2 bulk phases with their values in bulk structures tetragonally deformed to reproduce the interfacial strain.…”
Section: Resultsmentioning
confidence: 99%
“…10 A significant enhancement of the ionic conductivity through the interface plane up to 2 orders of magnitude with respect to bulk materials has been reported for a junction formed by thin layers of YSZ and samarium-doped ceria, deposited on a MgO substrate with a buffer layer of SrTiO 3 (STO). 11 Furthermore, the influence of interfaces on the ionic conductivity of heterostructures made of cubicstabilized zirconia and different insulating oxides has been investigated by Janek's group with the aim of correlating the interfacial ion conductivity in the multilayer with the interface microstructural properties. 12,13 An enhancement of 2 orders of magnitude in the ionic conductivity was obtained for samples with incoherent interfaces, while coupling oxide materials with the same crystal structure but slightly different lattice parameters forming semicoherent interfaces led to a slight conductivity increase and reduction for tensile and compressive strains, respectively.…”
Section: Introductionmentioning
confidence: 99%
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“…18 However, MgO(001) (a ¼ b ¼ c ¼ 4.219 Å ) is incompatible for the epitaxial growth of CGO (a ¼ b ¼ c ¼ 5.418 Å ) thin films due to its large lattice mismatch ja CGO À a MgOð110Þ j=a CGO Â 100 ¼ 9:1% resulting in blocking effects due to large grain boundary network. 13,19 For CGO films deposited on MgO(001), occurrence of dislocations starts soon after film nucleation to accommodate the large mismatch with typically large mosaic spread accompanied by columnar growth. 9,20 The critical thickness at which dislocations begin to form varies (approximately) inversely with lattice mismatch.…”
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confidence: 99%
“…Moreover, in this work, the conductivity of epitaxial CGO films are measured in air (high P O 2 ) where the ionic conductivity has been demonstrated to be dominant. 9,19 Pulsed laser deposition (PLD) technique was used to deposit the thin films in this work. X-ray diffraction (XRD) technique was used not only to understand the epitaxial nature of CGO thin films but also to measure the strain in them.…”
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confidence: 99%