2017
DOI: 10.1088/1361-6463/aa8604
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Enhancement of local piezoelectric properties of a perforated ferroelectric thin film visualized via piezoresponse force microscopy

Abstract: The local piezoresponse in a Ba 0.8 Sr 0.2 TiO 3 epitaxial ferroelectric film perforated by cylindrical channels has been investigated experimentally by means of piezoresponse force microscopy (PFM). A large enhancement of the effective values for both lateral and vertical components of piezoelectric tensor was experimentally detected in the perforated film as compared to non-perforated structure-by a factor of 8 for the lateral and by a factor 2 for the vertical piezoresponse. This result is consistent with t… Show more

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Cited by 3 publications
(1 citation statement)
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“…The employment of the local Atomic Force Microscopy (AFM) technique implemented in Piezoresponse Force mode (PFM), is a powerful tool here for studying piezo-and ferroelectric phenomena at the micro-and nanometers. This method allows for avoiding damage to the sample while applying a significantly high electric field (∼10 GV m −1 ) at the local scale [23][24][25]. In this method, a sharp conductive tip in contact with the surface is periodically biased, and bias-induced surface displacements are translated into the mechanical motion of the tip.…”
Section: Introductionmentioning
confidence: 99%
“…The employment of the local Atomic Force Microscopy (AFM) technique implemented in Piezoresponse Force mode (PFM), is a powerful tool here for studying piezo-and ferroelectric phenomena at the micro-and nanometers. This method allows for avoiding damage to the sample while applying a significantly high electric field (∼10 GV m −1 ) at the local scale [23][24][25]. In this method, a sharp conductive tip in contact with the surface is periodically biased, and bias-induced surface displacements are translated into the mechanical motion of the tip.…”
Section: Introductionmentioning
confidence: 99%