This paper reports, for the first time, the successful growth of 200 µm thick CdTe films on mis-oriented Ge(1 0 0) substrates by a cost-effective optimized close space sublimation method. It is found that, as the thickness increases to a few hundred micrometres, subgrains are formed probably as a result of the large density of dislocations and strain within the initial interfacial layers. The films are of high quality (x-ray rocking curve width ∼100 arcsec) and high resistance (∼109 Ω cm), and are thus candidates for x-ray and γ-ray detectors.