Growing Graphene on Semiconductors 2017
DOI: 10.1201/9781315186153-6
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Epitaxial Graphene on SiC: 2D Sheets, Selective Growth, and Nanoribbons

Abstract: Epitaxial graphene grown on SiC by the confinement controlled sublimation method is reviewed, with an emphasis on multilayer and monolayer epitaxial graphene on the carbon face of 4H-SiC and on directed and selectively grown structures under growth-arresting or growth-enhancing masks. Recent developments in the growth of templated graphene nanostructures are also presented, as exemplified by tens of micron long very well confined and isolated 20-40nm wide graphene ribbons. Scheme for large scale integration of… Show more

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Cited by 6 publications
(19 citation statements)
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“…SiC dies were outgassed at 800 °C prior to ramping to growth temperatures between 1400 and 1600 °C for 10–30 min, depending on the desired morphology. Incomplete graphene layers were also grown on 4H-SiC natural steps separated by large atomically flat terraces (5–20 μm) . For comparison, bare CMP 4H-SiC chips were also processed together with the graphene samples in the same MOVPE deposition runs.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…SiC dies were outgassed at 800 °C prior to ramping to growth temperatures between 1400 and 1600 °C for 10–30 min, depending on the desired morphology. Incomplete graphene layers were also grown on 4H-SiC natural steps separated by large atomically flat terraces (5–20 μm) . For comparison, bare CMP 4H-SiC chips were also processed together with the graphene samples in the same MOVPE deposition runs.…”
Section: Methodsmentioning
confidence: 99%
“…Incomplete graphene layers were also grown on 4H-SiC natural steps separated by large atomically flat terraces (5−20 μm). 48 For comparison, bare CMP 4H-SiC chips were also processed together with the graphene samples in the same MOVPE deposition runs. The above-mentioned graphene morphologies (single and multilayers, partially grown layers, and nanostructures) were used for h-BN film growth.…”
Section: Methodsmentioning
confidence: 99%
“…Details about the full furnace design and operating conditions can be found in Ref. [597,615]. The Si escape rate that ultimately determines the growth rate, is defined by the geometry of the hole (diameter 0.5 to 2 mm) [597,615].…”
Section: Iv12 Near Equilibrium Confinement Controlled Growthmentioning
confidence: 99%
“…[597,615]. The Si escape rate that ultimately determines the growth rate, is defined by the geometry of the hole (diameter 0.5 to 2 mm) [597,615]. The rate of graphene formation by CCS can be reduced by a factor >1000 compared to UHV sublimation, where 1LG grows on the C-face in ~1 min at T = 1.200 °C [597].…”
Section: Iv12 Near Equilibrium Confinement Controlled Growthmentioning
confidence: 99%
“…The epiGNRs studied in this work were selectively grown along the zigzag direction on the sidewalls of insulating 4H-SiC substrates by the confinement controlled sublimation method. 13,16 Before the growth, the SiC(0001) face was pre-patterned with 30-nm-deep trenches using electron-beam lithography and SF 6 -O 2 plasma etch. The expected width of epiGNRs is then $66 nm, determined by the trench depth and the sidewall facet angle (which is 27 from the basal plane).…”
mentioning
confidence: 99%