2011
DOI: 10.1016/j.tsf.2011.08.008
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Epitaxial growth and thermoelectric properties of TiNiSn and Zr0.5Hf0.5NiSn thin films

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Cited by 35 publications
(31 citation statements)
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“…In general, r increases with increase of the sputtering power, and the sample deposited at 80 W has the smallest r. The electrical conductivity of our Zr-Ni-Sn films is larger than those of other M-Ni-Sn thin films. 21,22 32. Although the r of the sample prepared at 80 W is the smallest among the four samples, its power factor S 2 r becomes the largest when the temperature reaches 393 K owing to its maximum S, as shown in Fig.…”
Section: Resultsmentioning
confidence: 85%
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“…In general, r increases with increase of the sputtering power, and the sample deposited at 80 W has the smallest r. The electrical conductivity of our Zr-Ni-Sn films is larger than those of other M-Ni-Sn thin films. 21,22 32. Although the r of the sample prepared at 80 W is the smallest among the four samples, its power factor S 2 r becomes the largest when the temperature reaches 393 K owing to its maximum S, as shown in Fig.…”
Section: Resultsmentioning
confidence: 85%
“…The largest value of S 2 r is 2.66 mW K À2 m À1 at 393 K, which is larger than those of other M-Ni-Sn films because both S and r of this sample are enhanced. 21,22 In addition, for the samples deposited at 120 W and 140 W, the power factors decrease with increasing T due to the reduction of S.…”
Section: Resultsmentioning
confidence: 99%
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“…This paper describes magnetron sputtering of (TiZr)NiSn on different substrates, including Si wafers, for the first time. Deposition of such films on MgO led to a slightly smaller Seebeck coefficient than bulk specimens [4], but our intention is to measure the difference when deposited on metallic substrates.…”
Section: Introductionmentioning
confidence: 99%
“…In this work, semiconducting NiYBi films were produced and investigated. Such films are expected to be good candidates for nanostructured thermoelectrics 4,5 The epitaxially grown films were investigated with respect to composition, crystalline structure, transport properties and electronic structure. Concerning the latter, hard X-ray photoelectron spectroscopy (HAXPES) is a powerful method for probing both chemical states and bulk electronic structures of thin films and buried layers in a non-destructive way 7 .…”
mentioning
confidence: 99%