GaN nanocolumns are one‐dimensional high‐quality dislocation‐free nano‐crystals. The effect of Be‐doping on GaN nanocolumns was investigated using InGaN/GaN nanocolumn LED structure grown by RF‐plasma‐assisted molecular‐beam epitaxy. Be was doped into the upper cladding region of the nanocolumn light‐emitting diodes (LEDs). Be is expected to be a p‐type dopant of GaN with a shallow accepter level, but p‐type conductivity was not obtained in these experiments. However, we observed a remarkable enhancement of the lateral growth of the GaN nanocolumn by Be doping; that is, the surface of the Be‐doped region became smooth and continuous with increasing Be doping concentration. The root mean square (RMS) surface roughness was reduced from 35 to 10 nm with increasing Be cell temperature from 710 to 975 °C. Cross‐sectional TEM observation revealed that no threading dislocations were generated in the observed area at the conjunction boundary between neighboring nanocolumns during lateral growth. This suggests that a high‐quality overgrowth layer with a low threading dislocation density can be realized on Be‐doped GaN nanocolumns. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)