EPMA–EDS surface measurements of interdiffusion coefficients between miscible metals in thin films

Christien, Frédéric; Pierson, J.F.; Hassini, Awatef; Capon, Fabien; Gall, René Le; Brousse, Thierry

doi:10.1016/j.apsusc.2009.10.019

Cited by 8 publications

(6 citation statements)

References 12 publications

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“…The dependence of several EDX parameters on beam energy using electron probe microanalysis on metallic films has been studied before [21][22][23][24][25]. Monte Carlo simulations were used to predict electron trajectories in samples with known structure and composition [23][24][25], based on theoretical probability distributions or empirical models.…”

Section: Introductionmentioning

confidence: 99%

Layered structure of friction films revealed by the comparison between multi-energy X-ray microanalysis and Monte Carlo simulations

Vasconcellos¹,

Soares²,

Hinrichs³

2012

Wear

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Section: Introductionmentioning

confidence: 99%

Layered structure of friction films revealed by the comparison between multi-energy X-ray microanalysis and Monte Carlo simulations

Vasconcellos¹,

Soares²,

Hinrichs³

2012

Wear

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“…EPMA permits one to analyze the composition of homogeneous materials in a region of few microns from the surface. The EPMA can be conducted using two different approaches: wavelength dispersive X-ray spectroscopy (WDS) [141] or energy dispersive X-ray spectroscopy [142][143][144][145][146]. WDS is generally considered an excellent method for microanalysis because is more sensitive and has a higher resolution than EDS, but it is more expensive and needs a dedicated device.…”

Section: Electron Probe Microanalysismentioning

confidence: 99%

“…EPMA was used by some authors to evaluate critical information about layered samples besides their thickness. Christien [145] used EDS measurement to determine the interdiffusion coefficient between thin films of miscible metals. Using various annealing temperature and Fick's diffusion equations, he was able to estimate the coefficients for an Ni film on Pd.…”

Section: Electron Probe Microanalysismentioning

confidence: 99%

Measuring the Thickness of Metal Coatings: A Review of the Methods

et al. 2020

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Thickness dramatically affects the functionality of coatings. Accordingly, the techniques in use to determine the thickness are of utmost importance for coatings research and technology. In this review, we analyse some of the most appropriate methods for determining the thickness of metallic coatings. In doing so, we classify the techniques into two categories: (i) destructive and (ii) non-destructive. We report on the peculiarity and accuracy of each of these methods with a focus on the pros and cons. The manuscript also covers practical issues, such as the complexity of the procedure and the time required to obtain results. While the analysis focuses most on metal coatings, many methods are also applicable to films of other materials.

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“…EPMA permits us to analyse the compositions of homogeneous materials in a region of few microns from the surface. The EPMA can be conducted using two different approaches: wavelength dispersive X-ray spectroscopy (WDS) [115] or energy-dispersive X-ray spectroscopy (EDS) [116][117][118][119][120]. WDS is generally considered an excellent method for microanalysis because it is more sensitive and has a higher resolution than EDS, but it is more expensive and needs a dedicated device.…”

Section: Electron Probe Microanalysismentioning

confidence: 99%

“…EPMA was used by some authors to evaluate important information about layered samples besides their thickness: Christien [119] used the EDS measurement to determine the interdiffusion coefficient between thin films of miscible metals. Using various annealing temperatures and the Fick's diffusion equations, he was able to estimate the coefficients for a Ni film on Pd.…”

Section: Electron Probe Microanalysismentioning

confidence: 99%

Measuring the Thickness of Metal Films: A Selection Guide to the Most Suitable Technique

Giurlani

Berretti

Lavacchi

et al. 2020

2nd Coatings and Interfaces Web Conference (CIWC-2 2020)

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The determination of thickness has a fundamental importance in all fields in which the implementation of films and coatings are required and takes a crucial role in the electroplating sector. The thickness influences many aspects of the coatings such as electrical, mechanical, corrosion protection, and even aesthetic properties. In the multitude of applications of thin layer coatings, the variability of thicknesses and materials is very high, as well as the variability of possible techniques that can be used to determine the characteristics of the layers of interest. The first distinction that can be made between these techniques is that which divides destructive techniques from non-destructive ones, in which, however, the semi- or micro-destructive techniques are immediately difficult to place. Other important parameters to consider are the cost, both for the purchase of the instrumentation and for each single analysis, the difficulties in preparing and measuring the sample, data processing, and obviously the detectable thickness ranges, the possible measurable materials, and precision and accuracy. The purpose of this work is to compare the characteristics of the various investigation methods, with a particular focus on metal film applications, so that it will be easier to choose the most suitable technique for each purpose.

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EPMA–EDS surface measurements of interdiffusion coefficients between miscible metals in thin films

Cited by 8 publications

References 12 publications

Layered structure of friction films revealed by the comparison between multi-energy X-ray microanalysis and Monte Carlo simulations

Layered structure of friction films revealed by the comparison between multi-energy X-ray microanalysis and Monte Carlo simulations

Measuring the Thickness of Metal Coatings: A Review of the Methods

Measuring the Thickness of Metal Films: A Selection Guide to the Most Suitable Technique

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