2014
DOI: 10.1103/physrevb.90.014108
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EPR parameters ofEcenters invSiO2from first-principles calculations

Abstract: A first-principles investigation of E centers in vitreous silica (v-SiO 2 ) based on calculations of the electron paramagnetic resonance (EPR) parameters is presented. The EPR parameters are obtained by exploiting the gauge including projector augmented wave method as implemented in the QUANTUM-ESPRESSO package. First, we analyze the EPR parameters of a large number of Si 2 dimers. The g tensor of the Si 2 dimers is shown to possess an average rhombic symmetry and larger g principal values with respect to thos… Show more

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Cited by 31 publications
(46 citation statements)
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“…[15][16][17] Calculations of the EPR of E centers remains an active field. 18 Most calculations have focused on bulk silica, but similar defects exist on silica and α-quartz surfaces. [19][20][21] Surface defects are particularly relevant in circuit processing because they can be buried at interfaces by overlaying other materials on top of the silica, and because their concentrations and properties can be controlled through the fabrication process.…”
Section: Introductionmentioning
confidence: 99%
“…[15][16][17] Calculations of the EPR of E centers remains an active field. 18 Most calculations have focused on bulk silica, but similar defects exist on silica and α-quartz surfaces. [19][20][21] Surface defects are particularly relevant in circuit processing because they can be buried at interfaces by overlaying other materials on top of the silica, and because their concentrations and properties can be controlled through the fabrication process.…”
Section: Introductionmentioning
confidence: 99%
“…The result is very close to 2.94 Å obtained in the previous report. 23 Even though the Si atoms relax far away from the center of oxygen vacancy, none of Si atoms can relax past the plane of its three oxygen neighbors. The unpaired spin density spreads between these two Si atoms, and the average charge is 0.54 |e| with a std of 0.20 |e|.…”
Section: Resultsmentioning
confidence: 99%
“…It is obvious that the average distance d Si-Si of the puckered 5× configurations is shorter than that of the puckered 4 × configurations, which is in good accordance with the previous report. 23 For the puckered 4× and 5 × configurations, the unpaired electron strongly localizes on the threefold silicon atom and around its three oxygen neighbors. The average Fermi contact of the puckered 5× configurations is 40.73 mT, which is close to the experimental result of the E γ center.…”
Section: Resultsmentioning
confidence: 99%
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