The local atomic arrangements in a commercial n-type wafer of Hg0.gCd0.2Te were investigated by measuring the diffuse x-ray scattering in two volumes in reciprocal space. A change in contrast between the two measurements was achieved by making one volume measurement at 12037 eV and a second volume measurement at 12270 eV, i.e., near the Hg Lm edge. The difference between these two measurements yielded intensity only due to Hg-Hg, Hg-Te, and Hg-Cd pair interactions. In all three patterns, peak-like features were apparent at the forbidden Bragg peak positions on thermal diffuse scattering ridges that joined major Bragg reflections; these are primarily attributed to second order displacement effects on the mixed cation sublattice. The first two Warren-Cowley short-range order parameters were determined to be an 0 = -0.050(26) and ffu 0 = 0.118(35). Simulations of the structure revealed small ordered regions with a preference for 3 :1 Hg-Cd near-neighbor configurations. The near-neighbor Hg-Te bonds contract from that calculated from the average crystal's lattice parameter, and this Hg-Te distance is less than the distance in HgTe.