Erratum: Atomic structure of a thin silica film on a<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:mi>Mo</mml:mi><mml:mo>(</mml:mo><mml:mn>112</mml:mn><mml:mo>)</mml:mo></mml:mrow></mml:math>substrate: A combined experimental and theoretical study [Phys. Rev. B<b>73</b>, 165414 (2006)]

Todorova, Tanya K.; Sierka, Marek; Sauer, Joachim; Kaya, Sarp; Weissenrieder, Jonas; Lu, Jinlian; Gao, Hongjun; Shaikhutdinov, Shamil K.; Freund, Hans‐Joachim

doi:10.1103/physrevb.73.249902

Cited by 20 publications

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“…[36] showed that isolated [SiO 4 ] clusters must appear in STM as large single spots (see Fig. 2g), at least at the tunneling parameters applied in the experiment, which does not fit the experimental observations.…”

Section: Scanning Tunneling Microscopy (Stm)mentioning

confidence: 56%

“…Furthermore, at certain tunneling parameters the Si atoms could be imaged (Fig 2b) and, again, this fact has been proven by comparing the experimental and simulated STM images [32,36]. [36] showed that isolated [SiO 4 ] clusters must appear in STM as large single spots (see Fig.…”

Section: Scanning Tunneling Microscopy (Stm)mentioning

confidence: 81%

“…Further XPS studies have verified formation of two different O species in the "Opoor" silica films [32,36]. Two overlapping signals centered at ~532.5 and ~531.…”

Section: X-ray Photoelectron Spectroscopy (Xps)mentioning

confidence: 99%

“…1c). (Note, that this structure was suggested but rejected by was further corroborated by density functional theory (DFT) calculations [32,36].…”

mentioning

confidence: 93%

“…In particular, the samples may contain small silica particles and clusters, whose properties may strongly influence the spectroscopic results. The systematic STM studies performed in [36] revealed that atomically flat films can be produced only after annealing at temperatures above 1200 K.…”

Section: Scanning Tunneling Microscopy (Stm)mentioning

confidence: 99%

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On the geometrical and electronic structure of an ultra-thin crystalline silica film grown on Mo(112)

et al. 2007

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Abstract. The atomic structure of a well-ordered silica film grown on a Mo(112) single crystal substrate is discussed in detail using the experimental and theoretical results available to date. New photoelectron spectroscopy results using synchrotron radiation and ultraviolet spectroscopy data are presented. The analysis unambiguously shows that the ultra-thin silica film consists of a two-dimensional network of corner sharing [SiO 4 ] tetrahedra chemisorbed on the unreconstructed Mo(112) surface. The review also highlights the important role of theoretical calculations in the determination of the atomic structure of the silica films and in interpretation of experimental data.

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Section: Scanning Tunneling Microscopy (Stm)mentioning

confidence: 56%

Section: Scanning Tunneling Microscopy (Stm)mentioning

confidence: 81%

“…Further XPS studies have verified formation of two different O species in the "Opoor" silica films [32,36]. Two overlapping signals centered at ~532.5 and ~531.…”

Section: X-ray Photoelectron Spectroscopy (Xps)mentioning

confidence: 99%

“…1c). (Note, that this structure was suggested but rejected by was further corroborated by density functional theory (DFT) calculations [32,36].…”

mentioning

confidence: 93%

Section: Scanning Tunneling Microscopy (Stm)mentioning

confidence: 99%

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On the geometrical and electronic structure of an ultra-thin crystalline silica film grown on Mo(112)

et al. 2007

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Ultrathin Silica Films on Metals: The Long and Winding Road to Understanding the Atomic Structure

2012

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This paper critically reviews the experimental and theoretical studies on the growth of ultrathin silica films onto metal single crystal substrates reported to date. The silica films on Mo(112) and Ru(0001) are discussed in more detail to demonstrate the key roles of the multi-technique approach and interplay between experiment and theory in the quest for understanding the atomic structure of the films. The results show the structural complexity and diversity of silica overlayers on metals, providing further information towards our understanding of the atomic structure, structural dynamics and physical and chemical properties of silica and related materials.

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Synthese und Struktur eines ultradünnen Alumosilicatfilms

et al. 2006

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Erratum: Atomic structure of a thin silica film on aMo(112)substrate: A combined experimental and theoretical study [Phys. Rev. B73, 165414 (2006)]

Cited by 20 publications

References 1 publication

On the geometrical and electronic structure of an ultra-thin crystalline silica film grown on Mo(112)

On the geometrical and electronic structure of an ultra-thin crystalline silica film grown on Mo(112)

Ultrathin Silica Films on Metals: The Long and Winding Road to Understanding the Atomic Structure

Synthese und Struktur eines ultradünnen Alumosilicatfilms

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