2018
DOI: 10.1103/physrevx.8.039902
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Erratum: Charged Point Defects in the Flatland: Accurate Formation Energy Calculations in Two-Dimensional Materials [Phys. Rev. X 4 , 031044 (2014)]

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Cited by 45 publications
(48 citation statements)
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“…SLABCC is based on the scheme proposed by Komsa and Pasquarello. [ 38 ] For the correction, the static dielectric constant ε0 should be used in principle if the ionic cores are allowed to relax. However, it was shown that, due to the explicit screening in the supercell, the high‐frequency value ε gives a better approximation.…”
Section: Methodsmentioning
confidence: 99%
“…SLABCC is based on the scheme proposed by Komsa and Pasquarello. [ 38 ] For the correction, the static dielectric constant ε0 should be used in principle if the ionic cores are allowed to relax. However, it was shown that, due to the explicit screening in the supercell, the high‐frequency value ε gives a better approximation.…”
Section: Methodsmentioning
confidence: 99%
“…The interlayer distances between Cd and X(Δ d 2 ) are also on the increase, while no evident change happens for the interlayer distance between the center two layers of Cd(Δ d 2 ) with different X. The binding energies of all the CdX monolayers (all higher than 3.0 eV) indicate that their stability and feasibility are comparable with other 2D materials . To confirm the dynamic stability of the CdX monolayers, we calculated phonon spectra of all the systems and the result of CdF is shown in Figure (d), and the other results can be found in Figure S1, Supporting Information.…”
Section: The Optimized Lattice Constants (A) Bond Lengths (Lcd − X Amentioning
confidence: 99%
“…By fitting the bands around high symmetry K or K’ point with the formula of v f = Δ E /Δ k , the Fermi velocities of all the systems are obtained and the results are presented in Table . They share with the same order Fermi velocity of graphene (10 6 m s −1 ) . It is important to note that the systems can change from semimetal into insulator after turning on SOC, and we will discuss the impact of SOC later.…”
Section: The Optimized Lattice Constants (A) Bond Lengths (Lcd − X Amentioning
confidence: 99%
“…[179] Defect centers are widely present in TMD samples and are being closely investigated both from experimental and modeling points of view. [197][198][199][200] They can act as trapping or scattering centers for charge carriers [146,201] and, at sufficiently large defect densities, potentially contribute to gain. Especially in the lowexcitation regime of monolayer gain materials, these contributions can be dominant due to fast exciton recombination into loss channels and little amounts of gain that can be expected from plasma contributions.…”
Section: Alternative Gain Mechanismsmentioning
confidence: 99%