2008
DOI: 10.1063/1.2899628
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Erratum: “Shape transition between symmetric and asymmetric structures in epitaxial three-dimensional strained islands” [Appl. Phys. Lett. 92, 031905 (2008)

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Cited by 5 publications
(7 citation statements)
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“…1(a)] is limited in spatial resolution by that of the detector to slightly below one micrometer [6,7]. In order to obtain higher spatial resolutions, two different magnifying imaging schemes have so far been used in the hard X-ray range [12]: magnified projection from a secondary point source [13] and magnified imaging using an objective lens [14][15][16]. Both imaging schemes have not yet been combined with absorption spectroscopy in the hard X-ray range, because in both cases chromatic effects need to be compensated for.…”
Section: Technical Reportsmentioning
confidence: 99%
“…1(a)] is limited in spatial resolution by that of the detector to slightly below one micrometer [6,7]. In order to obtain higher spatial resolutions, two different magnifying imaging schemes have so far been used in the hard X-ray range [12]: magnified projection from a secondary point source [13] and magnified imaging using an objective lens [14][15][16]. Both imaging schemes have not yet been combined with absorption spectroscopy in the hard X-ray range, because in both cases chromatic effects need to be compensated for.…”
Section: Technical Reportsmentioning
confidence: 99%
“…Many modern synchrotron radiation techniques, such as X-ray microscopy 1 and coherent diffractive imaging (Marchesini et al, 2003), rely on an accurate control of the X-ray wavefront. In the hard X-ray regime up to 12 keV photon energies, this can be conveniently done using diffractive optics; depending on the spatial arrangement of the diffractive optical device, the interference pattern results, for example, in a sub-50 nmsized bright spot in the focus of a Fresnel zone plate (Yin et al, 2006;Chu et al, 2008;Chen et al, 2008) or a rectangular flattop illumination for a beam-shaping condenser .…”
Section: Introductionmentioning
confidence: 99%
“…The reduction of the transition temperature decreases the surface tension and the viscosity, which consequently induces the coalescence process. For both X-ray irradiation and simultaneous imaging, we apply the full-field X-ray transmission microscopy (TXM) at photon energy of 8 keV on the 32-ID imaging beamline of the Advanced Photon Source at the Argonne National Laboratory [13], as illustrated in Fig. 1.…”
mentioning
confidence: 99%
“…The PMMA particles were deposited by evaporation on a clean Kapton tape (Kapton is transparent to X-rays) and directly illuminated with the focused X-rays in a normal direction to the incident X-ray beam. Real-time (Zernike-type) phase-contrast X-ray imaging with a phase ring is performed using the TXM with spatial and temporal resolutions of 40 nm and 50 ms, respectively [13]. The flux of the focused X-ray beam by the condenser lens was f = 2 × 10 11 photons s −1 at 8 keV [13].…”
mentioning
confidence: 99%
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