Erratum to: A New High-Voltage-Gain Non-Isolated Zero-Current-Switching Bidirectional DC–DC Converter

Thumma, Rajesh; Bhajana, Veera Venkata Subrahmanya Kumar; Drábek, Pavel; Jara, Martin

doi:10.1007/s13369-017-2795-5

Cited by 1 publication

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“…The growth rate of switching power supplies continues to rise annually, driven by the relentless advancement of power electronics and switching frequency technology. Concurrently, there is a rapid push towards making these power supplies lighter, smaller, thinner, with low noise, high reliability, and superior interference resistance [1]. This progress has led to their widespread adoption in various fields, including household appliances, security and surveillance, and communications.…”

Section: Introductionmentioning

confidence: 99%

A digital twin based reliability assessment of Superbuck converters

Xia

Yue

Chen

et al. 2023

Meas. Sci. Technol.

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Addressing the challenge of assessing the reliability of "Long-life, high-reliability" DC/DC analog converters in submarine observation networks and space power systems, which have limited internal observation points and insufficient valid information, and initial assessment rendered unreliable with the long-term operation of the converter. This paper proposes a novel method based on digital twin technology.The method eliminates the need for measuring internal variables, and only requires the measurement of the converter's ripple peak-to-peak. A digital Twin(DT) is constructed based on the underlying mechanism, and the parameters of the operating converter are identified through the collection of ripple peak-to-peak, which are then injected into the digital twin for dynamic tracking of the physical entity. By obtaining internal current and voltage of the DT and utilizing the Markov model, the reliability of the converter can be assessed.This method offers real-time reliability assessment without the need for additional measurement points. To validate the effectiveness of the proposed approach, a Superbuck converter is used as an example to demonstrate the high fidelity of the DT through isomorphic single-sample repeatability and isomorphic multiple-sample consistency experiments.

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Section: Introductionmentioning

confidence: 99%